Musallam, M., Johnson, C.M., Yin, Chunyan ORCID: 0000-0003-0298-0420 , Lu, Hua ORCID: 0000-0002-4392-6562 and Bailey, C. ORCID: 0000-0002-9438-3879 (2009) Real-time comparison of power module failure modes under in-service conditions. In: 2009 13th European Conference on Power Electronics and Applications, EPE '09. Institute of Electrical and Electronic Engineers, Inc, Piscataway, NJ, USA, pp. 1-10. ISBN 978-90-75815-13-9 (electronic), 978-1-4244-4432-8 (print)

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Abstract

In order to meet the through-life reliability targets for power modules, it is critical to understand the response of typical wear-out mechanisms, for example wire-bond lifting and solder degradation, to in-service environmental and load-induced thermal cycling. Application of accurate wear-out models can identify the dominant failure mechanisms at the design stage and can be employed in reliability assessment and health management under in-service conditions. The work in this paper presents the effect of power cycling frequency, load current and mean temperature on temperature variations within the power module structure and its impact on the life consumption for two common wear-out mechanisms (the bond wire and the substrate-solder). Compact real-time thermal models combined with physics of failure based reliability analysis are used to identify the dominant failure mechanism and predict the life-time of the power module for each thermal cycling condition. It is shown that bond wire degradation is the dominant failure mechanism for all power cycling conditions whereas substrate solder failure dominates for externally applied (ambient or passive) thermal cycling. In addition to informing the design process and enabling real-time health management, the knowledge gained from these studies can be used to design thermal cycling experiments for selected failure mechanisms.

Item Type:	Conference Proceedings
Title of Proceedings:	2009 13th European Conference on Power Electronics and Applications, EPE '09
Additional Information:	Article published in proceedings of Power Electronics and Applications, 2009. EPE '09. 13th European Conference in Barcelona, Spain from 8-10 September 2009.
Uncontrolled Keywords:	reliability targets, power modules, wear-out mechanisms, wire-bond lifting, solder degradation, load-induced thermal cycling, real-time thermal models, real-time health management
Subjects:	T Technology > T Technology (General) T Technology > TK Electrical engineering. Electronics Nuclear engineering
Pre-2014 Departments:	School of Computing & Mathematical Sciences School of Computing & Mathematical Sciences > Department of Mathematical Sciences
Related URLs:	Publisher Publisher Organisation Organisation
Last Modified:	20 Mar 2019 11:54
URI:	http://gala.gre.ac.uk/id/eprint/7818

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