Ismail, M. S., Salleh, M. F. S., Samsudin, A. H., Jailani, A., Le, Chi Hieu ORCID: https://orcid.org/0000-0002-5168-2297, Nguyen, Ho Quang and Mahmud, Jamal (2025) Numerical simulation and analysis of the post-buckling response of the stiffened panels. In: Proceeding of 6th International Conference on Advances in Manufacturing and Materials Engineering (ICAMME 2024). Lecture Notes in Mechanical Engineering (LNME) - Included in the following conference series: International conference on Advancement in Materials, Manufacturing, and Energy Engineering . Springer, Singapore, pp. 119-125. ISBN 978-9819638130; 978-9819638147 (doi:10.1007/978-981-96-3814-7_17)

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Abstract

This paper presents a study on the post-buckling response of stiffened panels to assess their load-carrying capability in buckling and post-buckling modes, with a focus on numerical investigation using Finite Element Analysis (FEA). The imperfection sensitivity was also studied to investigate the effect of geometric imperfections on the stability of the stiffened panels. The FEA results were validated against experimental data, showing substantial agreement. Shear damage failures were found to be the dominant factor causing the global collapse of the stiffened panels. The study demonstrates that FEA models can be effectively used for design analysis and optimization of reinforced panels subjected to axial compression loads.

Item Type:	Conference Proceedings
Title of Proceedings:	Proceeding of 6th International Conference on Advances in Manufacturing and Materials Engineering (ICAMME 2024)
Additional Information:	ICAMME 2024, 13—14 August, Kuala Lumpur, Malaysia.
Uncontrolled Keywords:	stiffened panel, finite element analysis, post-buckling analysis, damage mechanism
Subjects:	Q Science > Q Science (General) Q Science > QA Mathematics T Technology > T Technology (General)
Faculty / School / Research Centre / Research Group:	Faculty of Engineering & Science Faculty of Engineering & Science > School of Engineering (ENG)
Last Modified:	03 Jun 2025 13:36
URI:	http://gala.gre.ac.uk/id/eprint/50637

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