Items where Greenwich Author is "Best, Christopher How"
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Number of items: 1.
US Government
Yin, Chunyan
ORCID: 0000-0003-0298-0420
, Best, Chris, Bailey, Chris
ORCID: 0000-0002-9438-3879
and Stoyanov, Stoyan
ORCID: 0000-0001-6091-1226
(2015)
Statistical analysis of the impact of refinishing process on leaded components.
Microelectronics Reliability, 55 (2).
pp. 424-431.
ISSN 0026-2714
(doi:https://doi.org/10.1016/j.microrel.2014.11.001)