Moisture effects on the reliability of ACF interconnections
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Yin, Chunyan ORCID: 0000-0003-0298-0420 , Lu, Hua ORCID: 0000-0002-4392-6562 , Bailey, Chris ORCID: 0000-0002-9438-3879 and Chan, Yan-Cheong (2005) Moisture effects on the reliability of ACF interconnections. Electronics World, 111 (1836). pp. 20-24. ISSN 1365-4675
Full text not available from this repository.Item Type: | Article |
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Uncontrolled Keywords: | anisotropic conductive film, (ACF), moisture, flip chip technology |
Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
Pre-2014 Departments: | School of Computing & Mathematical Sciences School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis > Computational Mechanics & Reliability Group School of Computing & Mathematical Sciences > Department of Computer Systems Technology School of Computing & Mathematical Sciences > Department of Mathematical Sciences |
Related URLs: | |
Last Modified: | 20 Mar 2019 11:54 |
URI: | http://gala.gre.ac.uk/id/eprint/917 |
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