Article

Hinojosa Herrera, Ana Elsa ORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)