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Group by: Creators | Item Type | Uncontrolled Keywords | No Grouping
decision tree electronic device incomplete dataset logistic regression random forest
Number of items: 5.

decision tree

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

electronic device

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

incomplete dataset

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

logistic regression

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

random forest

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

This list was generated on Tue Dec 3 17:49:40 2024 UTC.