Article

Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Warner, M., Agha, A., Pericleous, K. ORCID: https://orcid.org/0000-0002-7426-9999, Parry, J., Marooney, C., Reeves, H. and Clark, I. (2002) Flo/Stress: an integrated software module to predict stress in electronic products. Computing and Control Engineering Journal, 13 (3). pp. 143-148. ISSN 0956-3385 (doi:10.1049/ccej:20020306)