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Bailey, C. 
ORCID: https://orcid.org/0000-0002-9438-3879, Warner, M., Agha, A., Pericleous, K. ORCID: https://orcid.org/0000-0002-7426-9999, Parry, J., Marooney, C., Reeves, H. and Clark, I.
(2002)
Flo/Stress: an integrated software module to predict stress in electronic products.
Computing and Control Engineering Journal, 13 (3).
pp. 143-148.
ISSN 0956-3385
(doi:10.1049/ccej:20020306)