Items where Author is "Yin, C."
backlight units
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
backlights
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
design environment
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
electro-migration
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Zhu, X., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2012)
Modelling metal migration for high reliability components when subjected to thermo-mechanical loading.
In: Proceedings of the 2012 IEEE 14th Electronics Packaging Technology Conference.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 474-478.
ISBN 9781467345538
(doi:10.1109/EPTC.2012.6507130)
finite element analysis
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
human vision models
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
junction temperatures
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
just-noticeable difference
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
key parameters
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
LCD
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
LED
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
LED backlighting devices
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
light emitting diodes (LEDs)
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
luminance
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
metal migration
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Zhu, X., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2012)
Modelling metal migration for high reliability components when subjected to thermo-mechanical loading.
In: Proceedings of the 2012 IEEE 14th Electronics Packaging Technology Conference.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 474-478.
ISBN 9781467345538
(doi:10.1109/EPTC.2012.6507130)
multi-disciplinary analysis
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
multi-disciplinary design
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Tilford, T.
ORCID: https://orcid.org/0000-0001-8307-6403, Rizvi, J. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2009)
Co-design and multi-physics analysis for power electronic modules.
In: 2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009.
IEEE Computer Society, Piscataway, NJ USA.
ISBN 9781424441600
(doi:10.1109/ESIME.2009.4938505)
multi-physics
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Tilford, T.
ORCID: https://orcid.org/0000-0001-8307-6403, Rizvi, J. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2009)
Co-design and multi-physics analysis for power electronic modules.
In: 2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009.
IEEE Computer Society, Piscataway, NJ USA.
ISBN 9781424441600
(doi:10.1109/ESIME.2009.4938505)
optical and thermal modelling techniques
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
optical performance
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
optical simulation
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
Power Electronic Module (PEM)
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420 and Ridout, S.
(2008)
Predictive reliability, prognostics and risk assessment for power modules.
CIPS 2008: 5th International Conference on Integrated Power Electronics Systems. Proceedings, March, 11-13, 2008 Nuremberg/Germany.
ETG-Fachbericht
(111).
VDE Verlag GmbH, Berlin-Offenbach, Germany, pp. 19-26.
ISBN 9783800730896
predictive reliability
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420 and Ridout, S.
(2008)
Predictive reliability, prognostics and risk assessment for power modules.
CIPS 2008: 5th International Conference on Integrated Power Electronics Systems. Proceedings, March, 11-13, 2008 Nuremberg/Germany.
ETG-Fachbericht
(111).
VDE Verlag GmbH, Berlin-Offenbach, Germany, pp. 19-26.
ISBN 9783800730896
ray tracing calculations
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
risk assessment
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420 and Ridout, S.
(2008)
Predictive reliability, prognostics and risk assessment for power modules.
CIPS 2008: 5th International Conference on Integrated Power Electronics Systems. Proceedings, March, 11-13, 2008 Nuremberg/Germany.
ETG-Fachbericht
(111).
VDE Verlag GmbH, Berlin-Offenbach, Germany, pp. 19-26.
ISBN 9783800730896
ruggedized electronic display
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
solid state lighting
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
solid state lighting systems
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)
thermal management
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Lee, Y., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Strusevich, N. and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2010)
Packaging of LED backlights for ruggedised displays.
In: International Symposium on Advanced Packaging Materials: Microtech, 2010. APM '10.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 98-101.
ISBN 9781424467563
(doi:10.1109/ISAPM.2010.5441377)
thermo-mechanical loading
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Zhu, X., Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420
(2012)
Modelling metal migration for high reliability components when subjected to thermo-mechanical loading.
In: Proceedings of the 2012 IEEE 14th Electronics Packaging Technology Conference.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 474-478.
ISBN 9781467345538
(doi:10.1109/EPTC.2012.6507130)
viewability
Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Yin, C.
ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562 and Cartwright, C.
(2011)
Multi-physics and multi-disciplinary analysis for solid state lighting.
In: 2011 12th Int. Conf. on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2011.
IEEE Computer Society, Piscataway, USA.
ISBN 9781457701078
(doi:10.1109/ESIME.2011.5765859)