Items where Author is "Tang, Ying Kit"
Book Section
Rajaguru, Pushpa ORCID: https://orcid.org/0000-0002-6041-0517, Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226, Tang, Ying Kit, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Claverley, James, Leach, Richard and Topham, David
(2010)
Numerical modelling methodology for design of miniaturised integrated products - an application to 3D CMM micro-probe development.
2010 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation, and Experiments in Microelectronics and Microsystems, EuroSimE 2010.
IEEE Computer Society, Piscataway NJ.
ISBN 9781424470266
(doi:10.1109/ESIME.2010.5464573)
Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Tang, Ying Kit, Bailey, Christopher
ORCID: https://orcid.org/0000-0002-9438-3879, Evans, Robert, Marson, Silvia and Allen, David
(2009)
Modelling and process capability analysis of focused ion beam.
ISSE 2009: 32nd International Spring Seminar on Electronics Technology: Hetero System Integration, the path to New Solutions in the Modern Electronics - Conference Proceedings.
IEEE Computer Society, Piscataway, NJ USA.
ISBN 97814244 42607 (Print)
(doi:10.1109/ISSE.2009.5206925)
Bailey, Christopher, Stoyanov, Stoyan, Tang, Ying Kit, Xue, Xiangdong and Tilford, Tim (2008) Multi-physics modelling for the fabrication, packaging and reliability of micro-systems components. In: Schrefler, B.A. and Perego, U., (eds.) 8th World Congress on Computational Mechanics (WCCM8) and 5th European Congress on Computational Methods in Applied Sciences and Engineering (ECCOMAS 2008), 30 June - 4 July 2008, Venice, Italy. International Center for Numerical Methods in Engineering (CIMNE), Barcelona, Spain. ISBN 978-84-96736-55-9
Conference Proceedings
Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Rajaguru, Pushpa
ORCID: https://orcid.org/0000-0002-6041-0517, Tang, Ying Kit, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Claverley, James and Leach, Richard
(2010)
Reduced order modelling for risk mitigation in design of miniaturised/integrated products.
In: ISSE 2010 - 33rd International Spring Seminar on Electronics Technology: Polymer Electronics and Nanotechnologies: Towards System Integration - Conference Proceedings.
IEEE Computer Society, Piscataway, USA, pp. 402-407.
ISBN 9781424478491 (print), 9781424478507 (online)
(doi:10.1109/ISSE.2010.5547362)
Narania, Sailesh, Eshahawi, Tarek, Gindy, Nabil, Tang, Ying Kit, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Ridout, Stephen and Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879
(2008)
Risk mitigation framework for a robust design process.
In: 2nd Electronics System-Integration Technology Conference, 2008. ESTC 2008.
IEEE Conference Publications
.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 1075-1080.
ISBN 978-1-4244-2814-4 (Print), 978-1-4244-2813-7 (Online)
(doi:10.1109/ESTC.2008.4684501)
Tang, Ying Kit, Stoyanov, S. ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C.
ORCID: https://orcid.org/0000-0002-9438-3879 and Chan, Y.C.
(2008)
Uncertainty analysis to minimise risk in designing micro-electronics manufacturing processes.
In: 2nd Electronics System-Integration Technology Conference, 2008. ESTC 2008.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 941-946.
ISBN 978-1-4244-2814-4 (Print), 978-1-4244-2813-7 (Electronic)
(doi:10.1109/ESTC.2008.4684478)
Thesis
Tang, Ying Kit (2012) A risk analysis methodology for micro/nano manufacturing. PhD thesis, University of Greenwich.