Items where Author is "Pietrikova, Alena"
Focused Ion Beam (FIB)
Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226 and Marson, Silvia
(2011)
Model assisted process control in micro- and nano-fabrication using focused ion beam.
In: Electronics Technology (ISSE), 2011 34th International Spring Seminar on.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 424-429.
ISBN 978-1-4577-2111-3
ISSN 2161-2528
(doi:10.1109/ISSE.2011.6053900)
micro-fabrication
Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226 and Marson, Silvia
(2011)
Model assisted process control in micro- and nano-fabrication using focused ion beam.
In: Electronics Technology (ISSE), 2011 34th International Spring Seminar on.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 424-429.
ISBN 978-1-4577-2111-3
ISSN 2161-2528
(doi:10.1109/ISSE.2011.6053900)
modelling
Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226 and Marson, Silvia
(2011)
Model assisted process control in micro- and nano-fabrication using focused ion beam.
In: Electronics Technology (ISSE), 2011 34th International Spring Seminar on.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 424-429.
ISBN 978-1-4577-2111-3
ISSN 2161-2528
(doi:10.1109/ISSE.2011.6053900)
nano-fabrication
Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226 and Marson, Silvia
(2011)
Model assisted process control in micro- and nano-fabrication using focused ion beam.
In: Electronics Technology (ISSE), 2011 34th International Spring Seminar on.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 424-429.
ISBN 978-1-4577-2111-3
ISSN 2161-2528
(doi:10.1109/ISSE.2011.6053900)
precision engineering
Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226 and Marson, Silvia
(2011)
Model assisted process control in micro- and nano-fabrication using focused ion beam.
In: Electronics Technology (ISSE), 2011 34th International Spring Seminar on.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 424-429.
ISBN 978-1-4577-2111-3
ISSN 2161-2528
(doi:10.1109/ISSE.2011.6053900)