Items where Author is "Musallam, M."
Conference Proceedings
Musallam, M., Johnson, C.M., Yin, Chunyan ORCID: https://orcid.org/0000-0003-0298-0420, Bailey, Christopher
ORCID: https://orcid.org/0000-0002-9438-3879 and Mermet-Guyennet, M.
(2010)
Real-time life consumption power modules prognosis using on-line rainflow algorithm in metro applications.
In: Energy Conversion Congress and Exposition (ECCE), 2010 IEEE.
IEEE Xplore Digital Library, Atlanta GA, pp. 970-977.
ISBN 978-1-4244-5286-6 (print)
ISSN 978-1-4244-5287-3 (online)
(doi:10.1109/ECCE.2010.5617883)
Yin, Chunyan ORCID: https://orcid.org/0000-0003-0298-0420, Lu, Hua
ORCID: https://orcid.org/0000-0002-4392-6562, Musallam, M., Bailey, Christopher
ORCID: https://orcid.org/0000-0002-9438-3879 and Johnson, C.M.
(2010)
In-service reliability assessment of solder interconnect in power electronics modules.
In: 2010 Prognostics and System Health Management Conference, PHM '10.
IEEE Conference Publications
.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA.
ISBN 9781424447565 (Print), 9781424447589 (Online)
(doi:10.1109/PHM.2010.5413346)
Musallam, M., Johnson, C.M., Yin, Chunyan ORCID: https://orcid.org/0000-0003-0298-0420, Lu, Hua
ORCID: https://orcid.org/0000-0002-4392-6562 and Bailey, C.
ORCID: https://orcid.org/0000-0002-9438-3879
(2009)
Real-time comparison of power module failure modes under in-service conditions.
In: 2009 13th European Conference on Power Electronics and Applications, EPE '09.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, NJ, USA, pp. 1-10.
ISBN 978-90-75815-13-9 (electronic), 978-1-4244-4432-8 (print)
Yin, C.Y. ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Musallam, M., Bailey, C.
ORCID: https://orcid.org/0000-0002-9438-3879 and Johnson, C. M.
(2008)
A prognostic assessment method for power electronics modules.
In: 2nd Electronics System-Integration Technology Conference, 2008. ESTC 2008.
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 1353-1358.
ISBN 978-1-4244-2814-4 (Print), 978-1-4244-2813-7 (Online)
(doi:10.1109/ESTC.2008.4684552)
Yin, C.Y, ORCID: https://orcid.org/0000-0003-0298-0420, Lu, H.
ORCID: https://orcid.org/0000-0002-4392-6562, Musallam, M., Bailey, C.
ORCID: https://orcid.org/0000-0002-9438-3879 and Johnson, C.M.
(2008)
A physics-of-failure based prognostic method for power modules.
In: 10th Electronics Packaging Technology Conference (EPTC 2008).
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 1190-1195.
ISBN 9781424421176
(doi:10.1109/EPTC.2008.4763591)