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Items where Author is "Mihaylova, Lyudmila"

Items where Author is "Mihaylova, Lyudmila"

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advanced manufacturing artificial intelligence Deep learning Gaussian mixture models material surface chemistry microscopy probabilistic clustering secondary electron hyperspectral imaging secondary electron spectroscopy super-resolution unsupervised learning
Number of items: 11.

advanced manufacturing

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

artificial intelligence

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

Deep learning

Alsari, Ali, Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T.H, Rodenburg, Cornelia and Mihaylova, Lyudmila (2026) A spectral-spatial deep learning for secondary electron hyperspectral image super-resolution. In: 29th International Conference on Information Fusion (FUSION). Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey. (In Press)

Gaussian mixture models

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

material surface chemistry

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

microscopy

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

probabilistic clustering

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

secondary electron hyperspectral imaging

Alsari, Ali, Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T.H, Rodenburg, Cornelia and Mihaylova, Lyudmila (2026) A spectral-spatial deep learning for secondary electron hyperspectral image super-resolution. In: 29th International Conference on Information Fusion (FUSION). Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey. (In Press)

secondary electron spectroscopy

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

super-resolution

Alsari, Ali, Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T.H, Rodenburg, Cornelia and Mihaylova, Lyudmila (2026) A spectral-spatial deep learning for secondary electron hyperspectral image super-resolution. In: 29th International Conference on Information Fusion (FUSION). Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey. (In Press)

unsupervised learning

Zhang, Jingqiong ORCID logoORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T. H. ORCID logoORCID: https://orcid.org/0000-0001-6761-3600, Nohl, James, Lai, Yufeng ORCID logoORCID: https://orcid.org/0000-0002-9987-0975, Abrams, Kerry J., Black, Kate, Willmott, Jon ORCID logoORCID: https://orcid.org/0000-0002-4242-1204, Rodenburg, Cornelia ORCID logoORCID: https://orcid.org/0000-0002-9590-375X and Mihaylova, Lyudmila ORCID logoORCID: https://orcid.org/0000-0001-5856-2223 (2025) Toward automated chemical analysis of materials using secondary electron hyperspectral imaging and unsupervised learning. IEEE Access, 13. pp. 173976-174000. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2025.3615908)

This list was generated on Sun May 31 09:04:32 2026 UTC.