A spectral-spatial deep learning for secondary electron hyperspectral image super-resolution
Alsari, Ali, Zhang, Jingqiong ORCID: https://orcid.org/0000-0003-2980-8145, Farr, Nicholas T.H, Rodenburg, Cornelia and Mihaylova, Lyudmila
(2026)
A spectral-spatial deep learning for secondary electron hyperspectral image super-resolution.
In: 29th International Conference on Information Fusion (FUSION).
Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey.
(In Press)
Preview |
PDF (Author's Accepted Manuscript)
53620 ZHANG_ A_Spectral-Spatial_Deep_Learning_For_Secondary_Electron_Hyperspectral_Image_(AAM)_2026.pdf - Accepted Version Available under License Creative Commons Attribution. Download (2MB) | Preview |
Abstract
The secondary electron hyperspectral imaging (SEHI) is a promising surface analysis method, especially for nano/micro chemical materials. However, SEHI poses challenges for achieving a trade-off between low-resolution imaging over a large field of view and high-resolution imaging over a limited field of view, and avoiding potential sample alteration caused by electron beam exposure. To address this limitation, we introduce, for the first time, a spectral-spatial deep learning model (SSDL) that produces a super-resolution SEHI image from a low resolution SEHI image, while substantially reducing the risk of sample alteration. Specifically, the SSDL model incorporates a spectral squeeze-and-excitation (SE) module and a spectral spatial fusion block, enhancing its flexibility in extracting both spatial and spectral features. Further, inception-residual modules are embedded within the proposed SSDL to capture multi-scale structural features. A custom spatial–spectral loss function is introduced, integrating a mean squared error (MSE), a spatial gradient loss, and a spectral angle mapper loss, which are essential for simultaneously preserving spectral and spatial integrity. The proposed model shows high performance compared to state-of-the-art methods during testing on two real SEHI datasets. Ablation experiments further confirm the effectiveness of the spectral SE block, inception-residual modules, and the custom loss function. This work demonstrates that deep learning can greatly enhance SEHI by considerably increasing the scanning throughput while preserving high-resolution, thereby improving the practical utility of SEHI for materials science.
| Item Type: | Conference Proceedings |
|---|---|
| Title of Proceedings: | 29th International Conference on Information Fusion (FUSION) |
| Uncontrolled Keywords: | super-resolution, secondary electron hyperspectral imaging, Deep learning |
| Subjects: | Q Science > Q Science (General) T Technology > T Technology (General) |
| Faculty / School / Research Centre / Research Group: | Faculty of Engineering & Science Faculty of Engineering & Science > School of Engineering (ENG) |
| Related URLs: | |
| Last Modified: | 29 May 2026 12:23 |
| URI: | https://gala.gre.ac.uk/id/eprint/53620 |
Actions (login required)
![]() |
View Item |
Downloads
Downloads per month over past year
Tools
Tools