Items where Author is "Goussetis, G."
    Pavuluri, S.K., Desmulliez, M.P.Y., Goussetis, G., Arrighi, V., Johnston, K., Adamietz, R., Tilford, T. and Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879
  
(2012)
Post cure behaviour of ancapsulants for QFN packages processed by an open-ended single mode resonant microwave applicator.
    
    
      In: Electronics Packaging Technology Conference (EPTC), 2011 13th.
    
    
    Institute of Electrical and Electronics Engineers, Piscataway, NJ, USA, pp. 573-578.
     ISBN 978-1-4577-1983-7 (Print), 978-1-4577-1981-3 (Online)
    
  
  
	 (doi:10.1109/EPTC.2011.6184486)
    Pavuluri, S.K., Ferenets, M., Goussetis, G., Desmulliez, M.P.Y., Tilford, T. ORCID: https://orcid.org/0000-0001-8307-6403, Adamietz, R., Muller, G., Eicher, F. and Bailey, C. 
ORCID: https://orcid.org/0000-0002-9438-3879
  
(2012)
Encapsulation of microelectronic components using open-ended microwave oven.
    IEEE Transactions on Components, Packaging and Manufacturing Technology, 2 (5).
     pp. 799-806.
     ISSN 2156-3950
  
  
	 (doi:10.1109/TCPMT.2011.2177524)
    Pavuluri, S.K., Ferenets, M., Goussetis, G., Desmulliez, M.P.Y., Tilford, T. ORCID: https://orcid.org/0000-0001-8307-6403, Adamietz, R., Muller, G., Eicher, F. and Bailey, C. 
ORCID: https://orcid.org/0000-0002-9438-3879
  
(2010)
Experimental investigation of open-ended microwave oven assisted encapsulation process.
    
    
      In: Electronics System Integration Technology Conference, ESTC 2010 - Proceedings.
    
    
    IEEE Computer Society, Piscataway, NJ, USA, pp. 1-6.
     ISBN 978-1-4244-8553-6 (print), 978-1-4244-8554-3 (online)
    
  
  
	 (doi:10.1109/ESTC.2010.5643015)
    Pavuluri, S.K., Tilford, T., Goussetis, G., Desmulliez, M.P.Y., Ferenets, M., Adamietz, R., Eicher, F. and Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879
  
(2010)
Advances in the design and test of a novel open ended microwave oven.
    
    
      In: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, DTIP 2010.
    
    
    IEEE Computer Society, Piscataway, USA, pp. 247-252.
     ISBN 9781424466368 (Print), 9782355000119 (Online)
    
  
  
	
    Sinclair, K.I., Goussetis, G., Desmulliez, M.P.Y., Sangster, A.J., Tilford, T. ORCID: https://orcid.org/0000-0001-8307-6403, Bailey, C. 
ORCID: https://orcid.org/0000-0002-9438-3879 and Parrott, A.K.
  
(2008)
Optimization of an open-ended microwave oven for microelectronics packaging.
    IEEE Transactions on Microwave Theory and Techniques, 56 (11).
     pp. 2635-2641.
     ISSN 0018-9480
  
  
	 (doi:10.1109/TMTT.2008.2005925)
    Tilford, T., Sinclair, K.I., Goussetis, G., Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Desmulliez, M.P.Y., Parrott, A.K. and Sangster, A.J.
  
(2008)
Numerical analysis of thermal stresses induced during VFM encapsulant curing.
    
    
      In: 31st International Spring Seminar on Electronics Technology, 2008. ISSE '08.
    
    
    Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 348-353.
     ISBN 978-1-4244-3972-0
    
  
  
	 (doi:10.1109/ISSE.2008.5276666)
    Tilford, T., Sinclair, K.I., Goussetis, G., Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Desmulliez, M.P.Y., Parrott, A.K. and Sangster, A.J.
  
(2008)
Numerical simulation of encapsulant curing within a variable frequency microwave processing system.
    
    
      In: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on.
    
    
    Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 447-454.
     ISBN 978-1-4244-2127-5
    
  
  
	 (doi:10.1109/ESIME.2008.4525086)
    Sinclair, K.I., Tilford, T., Desmulliez, M.Y.P., Goussetis, G., Bailey, C. ORCID: https://orcid.org/0000-0002-9438-3879, Parrott, K. and Sangster, A.J.
  
(2008)
Open ended microwave oven for packaging.
    
    
      In: Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS, 2008 (MEMS/MOEMS 2008).
    
    
    Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 16-20.
     ISBN 978-2-3550-0006-5
    
  
  
	 (doi:10.1109/DTIP.2008.4752943)
![[up]](/style/images/multi_up.png) Up a level
 Up a level