Skip navigation

Items where Author is "Conference Organizers, IEEE & ETFA"

Items where Author is "Conference Organizers, IEEE & ETFA"

[up] Up a level
Group by: Item Type | Uncontrolled Keywords | No Grouping
cyber risk formal analysis IoT applications safety security smart cities
Number of items: 6.

cyber risk

Khan, Muhammad Taimoor ORCID logoORCID: https://orcid.org/0000-0002-5752-6420 (2022) Towards practical and formal security risk analysis of IoT (Internet of Things) applications. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-4. ISBN 978-1665499965; 978-1665499972 (doi:10.1109/ETFA52439.2022.9921511)

formal analysis

Khan, Muhammad Taimoor ORCID logoORCID: https://orcid.org/0000-0002-5752-6420 (2022) Towards practical and formal security risk analysis of IoT (Internet of Things) applications. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-4. ISBN 978-1665499965; 978-1665499972 (doi:10.1109/ETFA52439.2022.9921511)

IoT applications

Khan, Muhammad Taimoor ORCID logoORCID: https://orcid.org/0000-0002-5752-6420 (2022) Towards practical and formal security risk analysis of IoT (Internet of Things) applications. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-4. ISBN 978-1665499965; 978-1665499972 (doi:10.1109/ETFA52439.2022.9921511)

safety

Mohsin, Ali, Aurangzeb, Sana, Aleem, Muhammad and Khan, Muhammad Taimoor ORCID logoORCID: https://orcid.org/0000-0002-5752-6420 (2022) On the performance and scalability of simulators for improving security and safety of smart cities. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-8. ISBN 978-1665499965; 978-1665499972 (doi:10.1109/ETFA52439.2022.9921600)

security

Mohsin, Ali, Aurangzeb, Sana, Aleem, Muhammad and Khan, Muhammad Taimoor ORCID logoORCID: https://orcid.org/0000-0002-5752-6420 (2022) On the performance and scalability of simulators for improving security and safety of smart cities. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-8. ISBN 978-1665499965; 978-1665499972 (doi:10.1109/ETFA52439.2022.9921600)

smart cities

Mohsin, Ali, Aurangzeb, Sana, Aleem, Muhammad and Khan, Muhammad Taimoor ORCID logoORCID: https://orcid.org/0000-0002-5752-6420 (2022) On the performance and scalability of simulators for improving security and safety of smart cities. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-8. ISBN 978-1665499965; 978-1665499972 (doi:10.1109/ETFA52439.2022.9921600)

This list was generated on Sun Dec 22 14:15:35 2024 UTC.