Khan, Muhammad Taimoor ORCID: 0000-0002-5752-6420 (2022) Towards practical and formal security risk analysis of IoT (Internet of Things) applications. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-4. ISBN 978-1665499965; 978-1665499972 (doi:https://doi.org/10.1109/ETFA52439.2022.9921511)

Mohsin, Ali, Aurangzeb, Sana, Aleem, Muhammad and Khan, Muhammad Taimoor ORCID: 0000-0002-5752-6420 (2022) On the performance and scalability of simulators for improving security and safety of smart cities. In: 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-8. ISBN 978-1665499965; 978-1665499972 (doi:https://doi.org/10.1109/ETFA52439.2022.9921600)