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Items where Author is "Ada, Mireilla Bikanga"

Items where Author is "Ada, Mireilla Bikanga"

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accuracy artificial intelligence codes cognition debugging educational institutions feed in tariff information and communication technology learning (artificial intelligence) loading modelling modules (abstract algebra) printing problem-solving programming technology tools
Number of items: 20.

accuracy

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

artificial intelligence

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

codes

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

cognition

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

debugging

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

educational institutions

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

feed in tariff

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

information and communication technology

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

learning (artificial intelligence)

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

loading

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

modelling

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

modules (abstract algebra)

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

printing

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

problem-solving

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

programming

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

technology

Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho, Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 and Matobobo, Courage (2026) Impact of AI explanation styles on IT students’ debugging accuracy, confidence, and reliance. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574352)

tools

Matobobo, Courage, Dzvapatsva, Godwin Pedzisai, Ncube, Prince Daughin Ngqabutho and Chinhamo, Edmore ORCID logoORCID: https://orcid.org/0000-0003-4684-7517 (2026) Evaluating project-based assessments as authentic measures of critical thinking in AI-infused environments: evidence from ICT modules. In: 2026 IEEE Global Engineering Education Conference (EDUCON), 27th - 30th April 2026, Cairo, Egypt. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-10. ISBN 979-8331576714 ISSN 2165-9559 (Print), 2165-9567 (Online) (doi:10.1109/EDUCON67543.2026.11574202)

This list was generated on Sat Oct 17 15:50:12 2026 BST.