Big Data; Data Veracity; Data Validity; FMEA; Statistics; Electronics Manufacturing; Quality Assurance; Test Limits Optimisation

Hinojosa Herrera, Ana ORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

Black Box, Classification, Veracity, Feature Selection, KNN, Stepwise

Hinojosa Herrera, Ana Elsa ORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)

FMEA, feature engineering, big data, data veracity, data validity, electronics manufacturing

Hinojosa Herrera, Ana Elsa ORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID: https://orcid.org/0000-0003-0253-7779, Bailey, Chris ORCID: https://orcid.org/0000-0002-9438-3879 and Yin, Chunyan ORCID: https://orcid.org/0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:10.1109/iCCECE46942.2019.8941849)

decision tree, logistic regression, random forest, incomplete dataset, electronic device

Hinojosa Herrera, Ana Elsa ORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

decision tree, production test set compaction, incomplete dataset, stop-on-fail test, electronic device qualification

Hinojosa Herrera, Ana Elsa ORCID: https://orcid.org/0000-0002-0636-1881 and Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226 (2019) Data driven predictive model to compact a production stop-on-fail test set for an electronic device. In: Proceedings of the 2018 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE Xplore, pp. 59-64. ISBN 9781538649046 (doi:10.1109/iCCECOME.2018.8658941)