Items where Greenwich Author is "Hinojosa Herrera, Ana"
Microsemi Corporation
Hinojosa Herrera, Ana Elsa ORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris
ORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879
(2020)
Improving Black Box Classification Model Veracity for Electronics Anomaly Detection.
In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA).
IEEE, pp. 1092-1097.
ISBN 978-1728151694
ISSN 2156-2318 (Print), 2158-2297 (Online)
(doi:10.1109/ICIEA48937.2020.9248258)
Microsemi Corporation (A Microchip company)
Hinojosa Herrera, Ana ORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris
ORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879
(2020)
Failure mode & effect analysis and another methodology for improving data veracity and validity.
Annals of Emerging Technologies in Computing (AETiC), 4 (3).
pp. 9-16.
ISSN 2516-0281
(doi:10.33166/AETiC.2020.03.002)