Items where Greenwich Author is "Hinojosa Herrera, Ana"
Microsemi Corporation
Hinojosa Herrera, Ana Elsa ORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)
Microsemi Corporation (A Microchip company)
Hinojosa Herrera, Ana ORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)