Kamara, E., Lu, H. ORCID: https://orcid.org/0000-0002-4392-6562, Thomas, O., Di Maio, D., Hunt, C. and Fulton, I. (2012) Modelling and experimental measurement of multiple joint lead free solder interconnects subjected to low cycle mechanical fatigue. In: European Microelectronics and Packaging. Institute of Electrical and Electronics Engineers, Piscataway, NJ, USA, pp. 1-6. ISBN 978-1-4673-0694-2

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Abstract

Ball Grid Arrays (BGAs) are one of the dominant technologies for high-end packaging solutions of electronic circuits, especially where a high interconnect density is required. This paper aims at studying the solder isothermal fatigue failure characteristics in test structures that resembles BGAs. Test structures comprising between 1 and 8 small solder joints have been made using 96.5Sn3.0Ag0.5Cu lead-free solder and subjected to cyclic mechanical loading that produced a shear force across the joints. The same structures were modelled using finite element analysis. The loading response distribution profile through the joints is analysed and the regions of likely failure identified to be along the shear band and at the stress concentration areas in the corners of the joints. Volume weighted average accumulated creep strain per cycle is used to analyse the failure of the individual joints where it is shown that greater damage occurs in the outer joints. Solder joint models of three different shapes are investigated: rectangular, convex and concave shapes. Results have shown that less damage occurs in the concave joints.

Item Type:	Conference Proceedings
Title of Proceedings:	European Microelectronics and Packaging
Additional Information:	Paper appears in Proceedings of 18th European Microelectronics and Packaging Conference (EMPC), 2011, between 12-15 September 2011, Brighton, East Sussex, UK.
Uncontrolled Keywords:	Ball Grid Arrays (BGAs), solder isothermal fatigue failure, 96.5Sn3.0Ag0.5Cu lead-free solder, concave joints
Subjects:	Q Science > QA Mathematics > QA75 Electronic computers. Computer science T Technology > TK Electrical engineering. Electronics Nuclear engineering
Pre-2014 Departments:	School of Computing & Mathematical Sciences School of Computing & Mathematical Sciences > Department of Mathematical Sciences
Related URLs:	Publisher Organisation
Last Modified:	20 Mar 2019 11:54
URI:	http://gala.gre.ac.uk/id/eprint/7883

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