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Comparative study of the effects of coalesced and distributed solder die attach voids on thermal resistance of packaged semiconductor device

Comparative study of the effects of coalesced and distributed solder die attach voids on thermal resistance of packaged semiconductor device

Otiaba, K.C., Bhatti, R.S., Ekere, N.N., Ekpu, M. and Adeyemi, J. (2011) Comparative study of the effects of coalesced and distributed solder die attach voids on thermal resistance of packaged semiconductor device. In: Collection of Papers Presented at the 17th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC' 2011). EDA Publishing Association, Grenoble, France, pp. 115-119. ISBN 9782355000188

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Abstract

Solder thermal interface materials are often used in power semiconductors to enhance heat dissipation from silicon die to the heat spreader. Nonetheless, the presence of voids in the die bond layer impedes heat flow and thus increases the chip junction temperature. Such voids which form easily in the solder joint during solder reflow process at manufacturing stage are primarily occasioned by out-gassing phenomenon. Three-dimensional finite element analysis is employed to investigate the thermal effects of lead-free solder void percentages and configurations on packaged semiconductor device. The thermal resistance for each voiding case is calculated to evaluate the thermal response of the resultant electronic package. The results show that for equivalent void percentage, thermal resistance increases more for large coalesced type voids in comparison to the small distributed void configurations. The results would assist packaging and design engineers in setting criteria for assessments of the thermal impacts of different solder void patterns.

Item Type: Conference Proceedings
Title of Proceedings: Collection of Papers Presented at the 17th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC' 2011)
Additional Information: [1] This paper is also published online by IEEE - see http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6081033 - ISBN 978-1-4577-0778-0 [2] This paper was presented at the 17th International Workshop on THERMal INvestigation of ICs and Systems (THERMINIC' 2011) held from 27-29 September 2011 in Paris, France. It was presented within the Package Thermal Issues Session held on 28 September 2011.
Uncontrolled Keywords: solder die attach, voids and thermal resistance
Subjects: T Technology > TA Engineering (General). Civil engineering (General)
Pre-2014 Departments: School of Engineering
School of Engineering > Department of Engineering Systems
Related URLs:
Last Modified: 14 Oct 2016 09:18
Selected for GREAT 2016: None
Selected for GREAT 2017: None
Selected for GREAT 2018: None
URI: http://gala.gre.ac.uk/id/eprint/7307

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