A critical analysis of polymer cure modeling for microelectronics applications
Morris, James E., Tilford, Tim, Ferenets, M. and Bailey, Christopher (2009) A critical analysis of polymer cure modeling for microelectronics applications. In: IMAPS Nordic Conference 2009, 13-15 September 2009, Tønsberg, Norway.Full text not available from this repository.
A review of polymer cure models used in microelectronics packaging applications reveals no clear consensus of
the chemical rate constants for the cure reactions, or even of an effective model. The problem lies in the contrast
between the actual cure process, which involves a sequence of distinct chemical reactions, and the models,
which typically assume only one, (or two with some restrictions on the independence of their characteristic
constants.) The standard techniques to determine the model parameters are based on differential scanning calorimetry (DSC), which cannot distinguish between the reactions, and hence yields results useful only under the same conditions, which completely misses the point of modeling. The obvious solution is for manufacturers to provide the modeling parameters, but failing that, an alternative experimental technique is required to determine individual reaction parameters, e.g. Fourier transform infra-red spectroscopy (FTIR).
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