# Modeling the diffusion of solid copper into liquid solder alloys

Rizvi, M.J., Lu, Hua and Bailey, Christopher
(2009)
*Modeling the diffusion of solid copper into liquid solder alloys.*
Thin Solid Films, 517 (5).
pp. 1686-1689.
ISSN 0040-6090
(doi:10.1016/j.tsf.2008.09.105)

## Abstract

During the soldering process, the copper atoms diffuse into liquid solders. The diffusion process determines integrity and the reworking possibility of a solder joint. In order to capture the diffusion scenarios of solid copper into liquid Sn–Pb and Sn–Cu solders, a computer modeling has been performed for 10 s. An analytical model has also been proposed for calculating the diffusion coefficient of copper into liquid solders. It is found that the diffusion coefficient for Sn–Pb solder is 2.74 × 10− 10 m2/s and for Sn–Cu solder is 6.44 × 10−9 m2/s. The modeling results reveal that the diffusion coefficient is one of the major factors that govern the rate at which solid Cu dissolve in the molten solder. The predicted dissolved amounts of copper into solders have been validated with the help of scanning electron microscopic analysis.

Item Type: | Article |
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Additional Information: | [1] Available online 15 October 2008. |

Uncontrolled Keywords: | modeling, copper, diffusion, solder |

Subjects: | T Technology > TN Mining engineering. Metallurgy Q Science > QA Mathematics Q Science > QC Physics |

Pre-2014 Departments: | School of Computing & Mathematical Sciences School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis > Computational Mechanics & Reliability Group School of Computing & Mathematical Sciences > Department of Computer Science School of Computing & Mathematical Sciences > Department of Computer Systems Technology School of Computing & Mathematical Sciences > Department of Mathematical Sciences |

Related URLs: | |

Last Modified: | 14 Oct 2016 09:04 |

URI: | http://gala.gre.ac.uk/id/eprint/1508 |

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