Optimisation methodology for risk mitigation in advanced micro-system electronics manufacturing
Tang, Y.K., Stoyanov, S., Bailey, C. and Chan, Y.C. (2008) Optimisation methodology for risk mitigation in advanced micro-system electronics manufacturing. In: EngOpt 2008 - International Conference on Engineering Optimization. Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil. ISBN 978-85-7650-152-7Full text not available from this repository.
This paper presents a design methodology based on numerical modelling, integrated with optimisation techniques and statistical methods, to aid the development of new advanced technologies in the area of micro and nano systems. The design methodology is demonstrated for a micro-machining process called Focused Ion Beam (FIB). This process has been modelled to provide knowledge of how a pre-defined geometry can be achieved through this direct milling. The geometry characterisation is obtained using a Reduced
Order Models (ROM), generated from the results of a mathematical model of the Focused Ion Beam, and Design of Experiment (DoE) methods. In this work, the focus is on the design flow methodology which includes an approach on how to include process parameter uncertainties into the process optimisation modelling framework. A discussion on the impact of the process parameters, and their variations, on the quality and performance of the fabricated structure is also presented. The design task is to identify the optimal process conditions, by altering the process parameters, so that certain reliability and confidence of the application is achieved and the imposed constraints are satisfied. The software tools used and developed to demonstrate the design methodology are also presented.
|Item Type:||Conference Proceedings|
|Title of Proceedings:||EngOpt 2008 - International Conference on Engineering Optimization|
|Additional Information:||This paper forms part of the Proceedings of EngOpt 2008 - International Conference on Engineering Optimization, held 1-5 June 2008, Rio de Janeiro, Brazil presented at the Industrial Applications Session http://www.engopt.org/nukleo/pdfs/0260_engopt_747_final.pdf|
|Uncontrolled Keywords:||optimisation, methodology, micro and nano system, focused ion beam|
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering|
Q Science > QA Mathematics
|School / Department / Research Groups:||School of Computing & Mathematical Sciences|
School of Computing & Mathematical Sciences > Department of Mathematical Sciences
|Last Modified:||28 May 2012 16:12|
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