Uncertainty analysis to minimise risk in designing micro-electronics manufacturing processes
Tang, Ying Kit, Stoyanov, S., Bailey, C. and Chan, Y.C. (2008) Uncertainty analysis to minimise risk in designing micro-electronics manufacturing processes. In: 2nd Electronics System-Integration Technology Conference, 2008. ESTC 2008. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 941-946. ISBN 978-1-4244-2814-4 (Print), 978-1-4244-2813-7 (Electronic) (doi:10.1109/ESTC.2008.4684478)Full text not available from this repository.
A design methodology based on numerical modelling, integrated with optimisation techniques and statistical methods, to aid the process control of micro and nano-electronics based manufacturing processes is presented in this paper. The design methodology is demonstrated for a micro-machining process called Focused Ion Beam (FIB). This process has been modelled to help understand how a pre-defined geometry of micro- and nano- structures can be achieved using this technology. The process performance is characterised on the basis of developed Reduced Order Models (ROM) and are generated using results from a mathematical model of the Focused Ion Beam and Design of Experiment (DoE) methods. Two ion beam sources, Argon and Gallium ions, have been used to compare and quantify the process variable uncertainties that can be observed during the milling process. The evaluations of the process performance takes into account the uncertainties and variations of the process variables and are used to identify their impact on the reliability and quality of the fabricated structure. An optimisation based design task is to identify the optimal process conditions, by varying the process variables, so that certain quality objectives and requirements are achieved and imposed constraints are satisfied. The software tools used and developed to demonstrate the design methodology are also presented.
|Item Type:||Conference Proceedings|
|Title of Proceedings:||2nd Electronics System-Integration Technology Conference, 2008. ESTC 2008|
|Additional Information:||This paper forms part of the Proceedings of the 2nd Electronics System-Integration Technology Conference, 2008 (ESTC 2008), held 1-4 September 2008, in Greenwich, London, UK. The event was organised by the Computational Mechanics and Reliability Group of the University of Greenwich and the UK and RI Chapter of IEEE Components, Packaging and Manufacturing Technology (CPMT) Society with additional input from the IEEE and iMAPS Europe and programme sponsorship from the Innovative Electronics Manufacturing Research Centre (IeMRC). ©2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.|
|Uncontrolled Keywords:||design methodology, micro-machining process, Focused Ion Beam (FIB) method, Design of Experiment (DoE) method, Reduced Order Models (ROM)|
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering
Q Science > QA Mathematics
|Pre-2014 Departments:||School of Computing & Mathematical Sciences
School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis
School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis > Computational Mechanics & Reliability Group
School of Computing & Mathematical Sciences > Department of Computer Systems Technology
School of Computing & Mathematical Sciences > Department of Mathematical Sciences
|Last Modified:||14 Oct 2016 09:03|
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