Optimisation modelling for design of advanced interconnects
Stoyanov, Stoyan and Bailey, Christopher (2006) Optimisation modelling for design of advanced interconnects. 1st Electronics Systemintegration Technology Conference. Dresden, Saxony, Germany. 2006 proceedings. IEEE, Piscataway, NJ, USA, pp. 1108-1117. ISBN 1424405521 (doi:10.1109/ESTC.2006.280148)Full text not available from this repository.
This paper describes a computational strategy for virtual design and prototyping of electronic components and assemblies. The design process is formulated as a design optimisation problem. The solution of this problem identifies not only the design which meets certain user specified requirements but also the design with the maximum possible improvement in particular aspects such as reliability, cost, etc. The modelling approach exploits numerical techniques for computational analysis (Finite Element Analysis) integrated with numerical methods for approximation, statistical analysis and optimisation. A software framework of modules that incorporates the required numerical techniques is developed and used to carry out the design optimisation modelling of fine-pitch flip-chip lead free solder interconnects.
|Item Type:||Book Section|
|Additional Information:||Presented at 1st Electronics Systemintegration Technology Conference (ESTC 2006). Dresden, Germany, 5-7 September 2006.|
|Uncontrolled Keywords:||electronics design, design optimistation, numerical modelling, computer modelling|
|Subjects:||T Technology > TK Electrical engineering. Electronics Nuclear engineering
Q Science > QA Mathematics
|Pre-2014 Departments:||School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis
School of Computing & Mathematical Sciences
School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis > Computational Mechanics & Reliability Group
School of Computing & Mathematical Sciences > Department of Computer Systems Technology
|Last Modified:||14 Oct 2016 09:02|
Actions (login required)