damage

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

Finite Element Method (FEM)

Hassan, Sheikh ORCID: https://orcid.org/0000-0002-6215-7340, Rajaguru, Pushparajah ORCID: https://orcid.org/0000-0002-6041-0517, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Chris and Tilford, Timothy ORCID: https://orcid.org/0000-0001-8307-6403 (2024) Coupled thermal-mechanical analysis of power electronic modules with finite element method and parametric model order reduction. Power Electronic Devices and Components:100063. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2024.100063)

IGBT

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

machine learning

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

Model Order Reduction (MOR)

Hassan, Sheikh ORCID: https://orcid.org/0000-0002-6215-7340, Rajaguru, Pushparajah ORCID: https://orcid.org/0000-0002-6041-0517, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Chris and Tilford, Timothy ORCID: https://orcid.org/0000-0001-8307-6403 (2024) Coupled thermal-mechanical analysis of power electronic modules with finite element method and parametric model order reduction. Power Electronic Devices and Components:100063. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2024.100063)

neural network

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

parametric Model Order Reduction (pMOR)

Hassan, Sheikh ORCID: https://orcid.org/0000-0002-6215-7340, Rajaguru, Pushparajah ORCID: https://orcid.org/0000-0002-6041-0517, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Chris and Tilford, Timothy ORCID: https://orcid.org/0000-0001-8307-6403 (2024) Coupled thermal-mechanical analysis of power electronic modules with finite element method and parametric model order reduction. Power Electronic Devices and Components:100063. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2024.100063)

physics-informed data

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

Power components

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

Power electronics module

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

Power Electronics Module (PEM)

Hassan, Sheikh ORCID: https://orcid.org/0000-0002-6215-7340, Rajaguru, Pushparajah ORCID: https://orcid.org/0000-0002-6041-0517, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Chris and Tilford, Timothy ORCID: https://orcid.org/0000-0001-8307-6403 (2024) Coupled thermal-mechanical analysis of power electronic modules with finite element method and parametric model order reduction. Power Electronic Devices and Components:100063. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2024.100063)

reliability

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

reliability assessment

Hassan, Sheikh ORCID: https://orcid.org/0000-0002-6215-7340, Rajaguru, Pushparajah ORCID: https://orcid.org/0000-0002-6041-0517, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Chris and Tilford, Timothy ORCID: https://orcid.org/0000-0001-8307-6403 (2024) Coupled thermal-mechanical analysis of power electronic modules with finite element method and parametric model order reduction. Power Electronic Devices and Components:100063. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2024.100063)

thermal fatigue

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)

thermal-mechanical analysis

Hassan, Sheikh ORCID: https://orcid.org/0000-0002-6215-7340, Rajaguru, Pushparajah ORCID: https://orcid.org/0000-0002-6041-0517, Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Chris and Tilford, Timothy ORCID: https://orcid.org/0000-0001-8307-6403 (2024) Coupled thermal-mechanical analysis of power electronic modules with finite element method and parametric model order reduction. Power Electronic Devices and Components:100063. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2024.100063)

Wire bonds

Stoyanov, Stoyan ORCID: https://orcid.org/0000-0001-6091-1226, Sulthana, Razia ORCID: https://orcid.org/0000-0001-5331-1310, Tilford, Tim ORCID: https://orcid.org/0000-0001-8307-6403, Zhang, Xiaotian, Hu, Yihua, Yang, Xingyu, Shen, Yaochun and Wang, Yangang (2025) Modelling the fatigue damage in power components using machine learning technology. Power Electronic Devices and Components, 10:100079. ISSN 2772-3704 (Online) (doi:10.1016/j.pedc.2025.100079)