K

Kao, A. ORCID: 0000-0002-6430-2134 , Shevchenko, N., Alexandrakis, M., Krastins, I., Eckert, S. and Pericleous, K. ORCID: 0000-0002-7426-9999 (2019) Thermal dependence of large scale freckle defect formation. Philosophical Transactions A: Mathematical, Physical and Engineering Sciences, 377 (2143). ISSN 1364-503X (Print), 1471-2962 (Online) (doi:https://doi.org/10.1098/rsta.2018.0206)