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R
Rajaguru, Pushparajah
ORCID: 0000-0002-6041-0517
, Lu, Hua
ORCID: 0000-0002-4392-6562
and Bailey, Chris
ORCID: 0000-0002-9438-3879
(2012)
Application of Kriging and radial basis function in power electronic module wire bond structure reliability under various amplitude loading.
International Journal of Fatigue, 45.
pp. 61-70.
ISSN 0142-1123
(doi:https://doi.org/10.1016/j.ijfatigue.2012.06.013)