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Items where Author is "Yu, W."

Items where Author is "Yu, W."

Group by: Item Type | Uncontrolled Keywords | No Grouping
Number of items: 18.

capillarity

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

capillary

Chen, H., Yu, W., Cargill, S., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Tonry, C. and Desmulliez, M.P.Y. (2012) Self-encapsulated hollow microstructures formed by electric field-assisted capillarity. Microfluidics and Nanofluidics, 13 (1). pp. 75-82. ISSN 1613-4982 (Print), 1613-4990 (Online) (doi:10.1007/s10404-012-0942-6)

dielectric liquids

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

domains

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

electric field effects

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

electrohydrodynamic

Chen, H., Yu, W., Cargill, S., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Tonry, C. and Desmulliez, M.P.Y. (2012) Self-encapsulated hollow microstructures formed by electric field-assisted capillarity. Microfluidics and Nanofluidics, 13 (1). pp. 75-82. ISSN 1613-4982 (Print), 1613-4990 (Online) (doi:10.1007/s10404-012-0942-6)

electrostatic

Li, H., Yu, W., Zhang, L., Liu, Z., Brown, K.E., Abraham, E., Cargill, S., Tonry, C., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Desmulliez, M.P.Y. (2013) Simulation and modelling of sub-30 nm polymeric channels fabricated by electrostatic induced lithography. RSC Advances, 3 (29). pp. 11839-11845. ISSN 2046-2069 (doi:10.1039/c3ra40188j)

flow simulation

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

high-aspect ratio microfabrication

Chen, H., Yu, W., Cargill, S., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Tonry, C. and Desmulliez, M.P.Y. (2012) Self-encapsulated hollow microstructures formed by electric field-assisted capillarity. Microfluidics and Nanofluidics, 13 (1). pp. 75-82. ISSN 1613-4982 (Print), 1613-4990 (Online) (doi:10.1007/s10404-012-0942-6)

hollow microstucture

Chen, H., Yu, W., Cargill, S., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Tonry, C. and Desmulliez, M.P.Y. (2012) Self-encapsulated hollow microstructures formed by electric field-assisted capillarity. Microfluidics and Nanofluidics, 13 (1). pp. 75-82. ISSN 1613-4982 (Print), 1613-4990 (Online) (doi:10.1007/s10404-012-0942-6)

instabilities

Chen, H., Yu, W., Cargill, S., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Tonry, C. and Desmulliez, M.P.Y. (2012) Self-encapsulated hollow microstructures formed by electric field-assisted capillarity. Microfluidics and Nanofluidics, 13 (1). pp. 75-82. ISSN 1613-4982 (Print), 1613-4990 (Online) (doi:10.1007/s10404-012-0942-6)

microfabrication

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

microfluidics

Chen, H., Yu, W., Cargill, S., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Tonry, C. and Desmulliez, M.P.Y. (2012) Self-encapsulated hollow microstructures formed by electric field-assisted capillarity. Microfluidics and Nanofluidics, 13 (1). pp. 75-82. ISSN 1613-4982 (Print), 1613-4990 (Online) (doi:10.1007/s10404-012-0942-6)

multiphase flow

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

nanopatterning

Li, H., Yu, W., Zhang, L., Liu, Z., Brown, K.E., Abraham, E., Cargill, S., Tonry, C., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Desmulliez, M.P.Y. (2013) Simulation and modelling of sub-30 nm polymeric channels fabricated by electrostatic induced lithography. RSC Advances, 3 (29). pp. 11839-11845. ISSN 2046-2069 (doi:10.1039/c3ra40188j)

polymer solutions

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

polymeric channels

Li, H., Yu, W., Zhang, L., Liu, Z., Brown, K.E., Abraham, E., Cargill, S., Tonry, C., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Desmulliez, M.P.Y. (2013) Simulation and modelling of sub-30 nm polymeric channels fabricated by electrostatic induced lithography. RSC Advances, 3 (29). pp. 11839-11845. ISSN 2046-2069 (doi:10.1039/c3ra40188j)

surface tension

Tonry, C.E.H., Patel, M.K., Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Desmuliez, M.P.Y. and Yu, W. (2013) Micro-scale modelling challenges in electric field assisted capillarity. In: Proceedings. 12th International Symposium on Distributed Computing and Applications to Business, Engineering & Science. DCABES 2013. IEEE Computer Society. Conference Publishing Services (CPS), Los Alamitos, CA, USA, 40- 43. ISBN 978-0769550602 (doi:10.1109/DCABES.2013.57)

This list was generated on Sun Dec 22 13:51:48 2024 UTC.