Items where Author is "Yin, C.Y,"
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Conference Proceedings
Yin, C.Y,
ORCID: 0000-0003-0298-0420
, Lu, H.
ORCID: 0000-0002-4392-6562
, Musallam, M., Bailey, C.
ORCID: 0000-0002-9438-3879
and Johnson, C.M.
(2008)
A physics-of-failure based prognostic method for power modules.
In: 10th Electronics Packaging Technology Conference (EPTC 2008).
Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 1190-1195.
ISBN 9781424421176
(doi:https://doi.org/10.1109/EPTC.2008.4763591)