affective computing

Bacon, Liz, Windall, Gillian and MacKinnon, Lachlan (2011) The development of a rich multimedia training environment for crisis management: using emotional affect to enhance learning. In: ALT-C 2011: Thriving in a colder and more challenging climate. Association for Learning Technology, Oxford, UK, pp. 67-78. ISBN 978-91-977071-4-5 (print), 978-91-977071-5-2 (online) (doi:10.3402/rlt.v19s1/7780)

affective impact in eLearning

Bacon, Liz, Windall, Gillian and MacKinnon, Lachlan (2011) The development of a rich multimedia training environment for crisis management: using emotional affect to enhance learning. In: ALT-C 2011: Thriving in a colder and more challenging climate. Association for Learning Technology, Oxford, UK, pp. 67-78. ISBN 978-91-977071-4-5 (print), 978-91-977071-5-2 (online) (doi:10.3402/rlt.v19s1/7780)

augmented reality simulations

Bacon, Liz, Windall, Gillian and MacKinnon, Lachlan (2011) The development of a rich multimedia training environment for crisis management: using emotional affect to enhance learning. In: ALT-C 2011: Thriving in a colder and more challenging climate. Association for Learning Technology, Oxford, UK, pp. 67-78. ISBN 978-91-977071-4-5 (print), 978-91-977071-5-2 (online) (doi:10.3402/rlt.v19s1/7780)

emotional markup

Bacon, Liz, Windall, Gillian and MacKinnon, Lachlan (2011) The development of a rich multimedia training environment for crisis management: using emotional affect to enhance learning. In: ALT-C 2011: Thriving in a colder and more challenging climate. Association for Learning Technology, Oxford, UK, pp. 67-78. ISBN 978-91-977071-4-5 (print), 978-91-977071-5-2 (online) (doi:10.3402/rlt.v19s1/7780)

timeline-based crisis scenarios

Bacon, Liz, Windall, Gillian and MacKinnon, Lachlan (2011) The development of a rich multimedia training environment for crisis management: using emotional affect to enhance learning. In: ALT-C 2011: Thriving in a colder and more challenging climate. Association for Learning Technology, Oxford, UK, pp. 67-78. ISBN 978-91-977071-4-5 (print), 978-91-977071-5-2 (online) (doi:10.3402/rlt.v19s1/7780)