Items where Author is "Ridout, S."
![]() | Up a level |
Jump to: Book Section
Number of items: 1.
Book Section
Bailey, C.
ORCID: 0000-0002-9438-3879
, Lu, H.
ORCID: 0000-0002-4392-6562
, Yin, C.
ORCID: 0000-0003-0298-0420
and Ridout, S.
(2008)
Predictive reliability, prognostics and risk assessment for power modules.
CIPS 2008: 5th International Conference on Integrated Power Electronics Systems. Proceedings, March, 11-13, 2008 Nuremberg/Germany.
ETG-Fachbericht
(111).
VDE Verlag GmbH, Berlin-Offenbach, Germany, pp. 19-26.
ISBN 9783800730896