Items where Author is "Ridout, S."
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Bailey, C. 
ORCID: https://orcid.org/0000-0002-9438-3879, Lu, H. ORCID: https://orcid.org/0000-0002-4392-6562, Yin, C. ORCID: https://orcid.org/0000-0003-0298-0420 and Ridout, S.
(2008)
Predictive reliability, prognostics and risk assessment for power modules.
CIPS 2008: 5th International Conference on Integrated Power Electronics Systems. Proceedings, March, 11-13, 2008 Nuremberg/Germany.
ETG-Fachbericht
(111).
VDE Verlag GmbH, Berlin-Offenbach, Germany, pp. 19-26.
ISBN 9783800730896