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Items where Author is "Patel, P."

Items where Author is "Patel, P."

Group by: Item Type | Uncontrolled Keywords | No Grouping
Number of items: 8.

educational technology

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

engineering education

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

Generative AI

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

privacy

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

problem-solving

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

retrieval augmented generation

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

surveys

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

training

Rana, S. P. ORCID logoORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C. (2025) Prompting and rag vs. student engagement and comprehension in educational technology. In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025. IEEE Xplore . Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7. ISBN 979-8331539498 (doi:10.1109/EDUCON62633.2025.11016579)

This list was generated on Thu Nov 20 03:20:48 2025 UTC.