Skip navigation

Items where Author is "Orsoni, Alessandra"

Items where Author is "Orsoni, Alessandra"

Up a level
Export as [feed] RSS
Group by: Item Type | Uncontrolled Keywords | No Grouping
Number of items: 4.

breaking point distance

Bello, L., Anang, K. A., Bakalis, P., Rapajic, P. B. and Eneh, Titus I. (2012) Sensitivity of DSR protocol performance to propagation loss models at higher microwave frequencies. In: 2012 Proceedings 14th International Conference on Modelling and Simulation (UKSim). IEEE Conference Publications . The Institute of Electrical and Electronics Engineers, Inc, California & Washington, USA and Tokyo, Japan, pp. 561-565. ISBN 978-0-7695-4682-7 (doi:https://doi.org/10.1109/UKSim.2012.85)

DSR

Bello, L., Anang, K. A., Bakalis, P., Rapajic, P. B. and Eneh, Titus I. (2012) Sensitivity of DSR protocol performance to propagation loss models at higher microwave frequencies. In: 2012 Proceedings 14th International Conference on Modelling and Simulation (UKSim). IEEE Conference Publications . The Institute of Electrical and Electronics Engineers, Inc, California & Washington, USA and Tokyo, Japan, pp. 561-565. ISBN 978-0-7695-4682-7 (doi:https://doi.org/10.1109/UKSim.2012.85)

mobile ad hoc network

Bello, L., Anang, K. A., Bakalis, P., Rapajic, P. B. and Eneh, Titus I. (2012) Sensitivity of DSR protocol performance to propagation loss models at higher microwave frequencies. In: 2012 Proceedings 14th International Conference on Modelling and Simulation (UKSim). IEEE Conference Publications . The Institute of Electrical and Electronics Engineers, Inc, California & Washington, USA and Tokyo, Japan, pp. 561-565. ISBN 978-0-7695-4682-7 (doi:https://doi.org/10.1109/UKSim.2012.85)

radio propagation model

Bello, L., Anang, K. A., Bakalis, P., Rapajic, P. B. and Eneh, Titus I. (2012) Sensitivity of DSR protocol performance to propagation loss models at higher microwave frequencies. In: 2012 Proceedings 14th International Conference on Modelling and Simulation (UKSim). IEEE Conference Publications . The Institute of Electrical and Electronics Engineers, Inc, California & Washington, USA and Tokyo, Japan, pp. 561-565. ISBN 978-0-7695-4682-7 (doi:https://doi.org/10.1109/UKSim.2012.85)

This list was generated on Fri Nov 22 02:38:11 2024 UTC.