Items where Author is "Kure, Halima I."
5G/6G network
Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Improving 5G/B5G network performance with RFID-enabled resource management systems.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
adversarial attacks
Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Detecting and preventing data poisoning attacks on AI models.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
Artificial Intelligence
Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Detecting and preventing data poisoning attacks on AI models.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
cybersecurity
Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Detecting and preventing data poisoning attacks on AI models.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
data poisoning
Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Detecting and preventing data poisoning attacks on AI models.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
machine learning
Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Detecting and preventing data poisoning attacks on AI models.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
model security
Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Detecting and preventing data poisoning attacks on AI models.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
network performance
Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Improving 5G/B5G network performance with RFID-enabled resource management systems.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
parameter
Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Reliability–centered maintenance using reliability parameters on gas compressors.
International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256.
ISSN 2156-1680 (Print), 2156-1672 (Online)
(doi:10.4018/IJMMME.367256)
predictive maintenance
Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Reliability–centered maintenance using reliability parameters on gas compressors.
International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256.
ISSN 2156-1680 (Print), 2156-1672 (Online)
(doi:10.4018/IJMMME.367256)
proactive maintenance
Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Reliability–centered maintenance using reliability parameters on gas compressors.
International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256.
ISSN 2156-1680 (Print), 2156-1672 (Online)
(doi:10.4018/IJMMME.367256)
radiofrequency identification
Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Improving 5G/B5G network performance with RFID-enabled resource management systems.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)
RCM
Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Reliability–centered maintenance using reliability parameters on gas compressors.
International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256.
ISSN 2156-1680 (Print), 2156-1672 (Online)
(doi:10.4018/IJMMME.367256)
reliability
Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Reliability–centered maintenance using reliability parameters on gas compressors.
International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256.
ISSN 2156-1680 (Print), 2156-1672 (Online)
(doi:10.4018/IJMMME.367256)
resource optimization
Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID: https://orcid.org/0000-0001-6591-5269
(2025)
Improving 5G/B5G network performance with RFID-enabled resource management systems.
In: 2025 PhotonIcs & Electromagnetics Research Symposium.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers (IEEE).
(In Press)