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Items where Author is "Kure, Halima I."

Items where Author is "Kure, Halima I."

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Number of items: 15.

5G/6G network

Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Improving 5G/B5G network performance with RFID-enabled resource management systems. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

adversarial attacks

Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Detecting and preventing data poisoning attacks on AI models. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

Artificial Intelligence

Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Detecting and preventing data poisoning attacks on AI models. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

cybersecurity

Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Detecting and preventing data poisoning attacks on AI models. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

data poisoning

Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Detecting and preventing data poisoning attacks on AI models. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

machine learning

Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Detecting and preventing data poisoning attacks on AI models. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

model security

Kure, Halima I., Sarkar, Pradipta, Ndanusa, Ahmed B. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Detecting and preventing data poisoning attacks on AI models. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

network performance

Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Improving 5G/B5G network performance with RFID-enabled resource management systems. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

parameter

Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Reliability–centered maintenance using reliability parameters on gas compressors. International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256. ISSN 2156-1680 (Print), 2156-1672 (Online) (doi:10.4018/IJMMME.367256)

predictive maintenance

Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Reliability–centered maintenance using reliability parameters on gas compressors. International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256. ISSN 2156-1680 (Print), 2156-1672 (Online) (doi:10.4018/IJMMME.367256)

proactive maintenance

Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Reliability–centered maintenance using reliability parameters on gas compressors. International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256. ISSN 2156-1680 (Print), 2156-1672 (Online) (doi:10.4018/IJMMME.367256)

radiofrequency identification

Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Improving 5G/B5G network performance with RFID-enabled resource management systems. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

RCM

Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Reliability–centered maintenance using reliability parameters on gas compressors. International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256. ISSN 2156-1680 (Print), 2156-1672 (Online) (doi:10.4018/IJMMME.367256)

reliability

Omozuhiomwen, Gregory Egbe, Kure, Halima I., Obi, Emenike Raymond, Ebenuwa, Solomon H., Ijemaru, Gerald K. and Nwajana, Augustine O. ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Reliability–centered maintenance using reliability parameters on gas compressors. International Journal of Manufacturing, Materials, and Mechanical Engineering (IJMMME), 14 (1):367256. ISSN 2156-1680 (Print), 2156-1672 (Online) (doi:10.4018/IJMMME.367256)

resource optimization

Arinze, Stella N., Kure, Halima I. and Nwajana, Augustine ORCID logoORCID: https://orcid.org/0000-0001-6591-5269 (2025) Improving 5G/B5G network performance with RFID-enabled resource management systems. In: 2025 PhotonIcs & Electromagnetics Research Symposium. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE). (In Press)

This list was generated on Sat Jun 7 18:58:28 2025 UTC.