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Items where Author is "James, M.N."

Items where Author is "James, M.N."

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crack closure crack closure crack shielding crack tip displacement crack tip shielding crack tip stress digital image correlation (DIC) experimental and applied mechanics fracture mechanics full field photoelasticity mathematical modelling Muskhelishvili photoelastic modelling photoelasticity plastic enclave plasticity plasticity-induced closure stress intensity factor t-stress
Number of items: 30.

crack closure

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) Towards a new model of crack tip stress fields. International Journal of Fracture, 148 (4). pp. 361-371. ISSN 0376-9429 (doi:10.1007/s10704-008-9209-3)

crack closure

Christopher, C.J., James, M.N., Patterson, E.A. and Tee, Kong ORCID logoORCID: https://orcid.org/0000-0003-3202-873X (2008) A quantitative evaluation of fatigue crack shielding forces using photoelasticity. Engineering Fracture Mechanics, 75 (14). pp. 4190-4199. ISSN 0013-7944 (doi:10.1016/j.engfracmech.2008.03.013)

crack shielding

James, M.N., Christopher, C.J., Lu, Yanwei, Tee, K.F. ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2011) Crack tip shielding from a plastic 'inclusion'. Key Engineering Materials, 465 (1). pp. 1-8. ISSN 1662-9795 (doi:10.4028/www.scientific.net/KEM.465.1)

Christopher, C.J., James, M.N., Patterson, E.A. and Tee, Kong ORCID logoORCID: https://orcid.org/0000-0003-3202-873X (2008) A quantitative evaluation of fatigue crack shielding forces using photoelasticity. Engineering Fracture Mechanics, 75 (14). pp. 4190-4199. ISSN 0013-7944 (doi:10.1016/j.engfracmech.2008.03.013)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) Towards a new model of crack tip stress fields. International Journal of Fracture, 148 (4). pp. 361-371. ISSN 0376-9429 (doi:10.1007/s10704-008-9209-3)

crack tip displacement

James, M.N., Christopher, C.J., Lu, Yanwei, Tee, K.F. ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2011) Crack tip shielding from a plastic 'inclusion'. Key Engineering Materials, 465 (1). pp. 1-8. ISSN 1662-9795 (doi:10.4028/www.scientific.net/KEM.465.1)

crack tip shielding

Christopher, C.J., James, M.N., Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2008) Evaluation of crack tip shielding using a photoelastic model. In: the SEM XI International Congress on Experimental and Applied Mechanics, 2-5 June 2008, Orlando, FL, USA,.

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. Key Engineering Materials, 345-34. pp. 199-204. ISSN 1013-9826 (doi:10.4028/www.scientific.net/KEM.345-346.199)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. In: 10th International Conference on the Mechanical Behavior of Materials (ICM), 27-31 May 2007, Busan, Korea. (Unpublished)

crack tip stress

James, M.N., Christopher, C.J., Lu, Yanwei, Tee, K.F. ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2011) Crack tip shielding from a plastic 'inclusion'. Key Engineering Materials, 465 (1). pp. 1-8. ISSN 1662-9795 (doi:10.4028/www.scientific.net/KEM.465.1)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) Towards a new model of crack tip stress fields. International Journal of Fracture, 148 (4). pp. 361-371. ISSN 0376-9429 (doi:10.1007/s10704-008-9209-3)

digital image correlation (DIC)

James, M.N., Christopher, C.J., Lu, Yanwei, Tee, K.F. ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2011) Crack tip shielding from a plastic 'inclusion'. Key Engineering Materials, 465 (1). pp. 1-8. ISSN 1662-9795 (doi:10.4028/www.scientific.net/KEM.465.1)

experimental and applied mechanics

Christopher, C.J., James, M.N., Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2008) Evaluation of crack tip shielding using a photoelastic model. In: the SEM XI International Congress on Experimental and Applied Mechanics, 2-5 June 2008, Orlando, FL, USA,.

fracture mechanics

Christopher, C.J., James, M.N., Patterson, E.A. and Tee, Kong ORCID logoORCID: https://orcid.org/0000-0003-3202-873X (2008) A quantitative evaluation of fatigue crack shielding forces using photoelasticity. Engineering Fracture Mechanics, 75 (14). pp. 4190-4199. ISSN 0013-7944 (doi:10.1016/j.engfracmech.2008.03.013)

full field photoelasticity

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) Towards a new model of crack tip stress fields. International Journal of Fracture, 148 (4). pp. 361-371. ISSN 0376-9429 (doi:10.1007/s10704-008-9209-3)

mathematical modelling

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) Towards a new model of crack tip stress fields. International Journal of Fracture, 148 (4). pp. 361-371. ISSN 0376-9429 (doi:10.1007/s10704-008-9209-3)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. Key Engineering Materials, 345-34. pp. 199-204. ISSN 1013-9826 (doi:10.4028/www.scientific.net/KEM.345-346.199)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. In: 10th International Conference on the Mechanical Behavior of Materials (ICM), 27-31 May 2007, Busan, Korea. (Unpublished)

Muskhelishvili

James, M.N., Christopher, C.J., Lu, Yanwei, Tee, K.F. ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2011) Crack tip shielding from a plastic 'inclusion'. Key Engineering Materials, 465 (1). pp. 1-8. ISSN 1662-9795 (doi:10.4028/www.scientific.net/KEM.465.1)

photoelastic modelling

Christopher, C.J., James, M.N., Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2008) Evaluation of crack tip shielding using a photoelastic model. In: the SEM XI International Congress on Experimental and Applied Mechanics, 2-5 June 2008, Orlando, FL, USA,.

photoelasticity

Christopher, C.J., James, M.N., Patterson, E.A. and Tee, Kong ORCID logoORCID: https://orcid.org/0000-0003-3202-873X (2008) A quantitative evaluation of fatigue crack shielding forces using photoelasticity. Engineering Fracture Mechanics, 75 (14). pp. 4190-4199. ISSN 0013-7944 (doi:10.1016/j.engfracmech.2008.03.013)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. Key Engineering Materials, 345-34. pp. 199-204. ISSN 1013-9826 (doi:10.4028/www.scientific.net/KEM.345-346.199)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. In: 10th International Conference on the Mechanical Behavior of Materials (ICM), 27-31 May 2007, Busan, Korea. (Unpublished)

plastic enclave

James, M.N., Christopher, C.J., Lu, Yanwei, Tee, K.F. ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2011) Crack tip shielding from a plastic 'inclusion'. Key Engineering Materials, 465 (1). pp. 1-8. ISSN 1662-9795 (doi:10.4028/www.scientific.net/KEM.465.1)

plasticity

Christopher, C.J., James, M.N., Patterson, E.A. and Tee, Kong ORCID logoORCID: https://orcid.org/0000-0003-3202-873X (2008) A quantitative evaluation of fatigue crack shielding forces using photoelasticity. Engineering Fracture Mechanics, 75 (14). pp. 4190-4199. ISSN 0013-7944 (doi:10.1016/j.engfracmech.2008.03.013)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) Towards a new model of crack tip stress fields. International Journal of Fracture, 148 (4). pp. 361-371. ISSN 0376-9429 (doi:10.1007/s10704-008-9209-3)

plasticity-induced closure

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. Key Engineering Materials, 345-34. pp. 199-204. ISSN 1013-9826 (doi:10.4028/www.scientific.net/KEM.345-346.199)

Tee, Kong-Fah ORCID logoORCID: https://orcid.org/0000-0003-3202-873X, Christopher, C.J., James, M.N. and Patterson, E.A. (2007) New insights into plasticity-induced crack tip shielding via mathematical modelling and full field photoelasticity. In: 10th International Conference on the Mechanical Behavior of Materials (ICM), 27-31 May 2007, Busan, Korea. (Unpublished)

stress intensity factor

Christopher, C.J., James, M.N., Patterson, E.A. and Tee, Kong ORCID logoORCID: https://orcid.org/0000-0003-3202-873X (2008) A quantitative evaluation of fatigue crack shielding forces using photoelasticity. Engineering Fracture Mechanics, 75 (14). pp. 4190-4199. ISSN 0013-7944 (doi:10.1016/j.engfracmech.2008.03.013)

t-stress

James, M.N., Christopher, C.J., Lu, Yanwei, Tee, K.F. ORCID logoORCID: https://orcid.org/0000-0003-3202-873X and Patterson, E.A. (2011) Crack tip shielding from a plastic 'inclusion'. Key Engineering Materials, 465 (1). pp. 1-8. ISSN 1662-9795 (doi:10.4028/www.scientific.net/KEM.465.1)

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