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Items where Author is "Hunt, Craig"

Items where Author is "Hunt, Craig"

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data mining electronic components intelligent manufacturing machine learning prognostics modelling smart qualification testing
Number of items: 6.

data mining

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

electronic components

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

intelligent manufacturing

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

machine learning

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

prognostics modelling

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

smart qualification testing

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

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