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Items where Author is "Hinojosa Herrera, Ana Elsa"

Items where Author is "Hinojosa Herrera, Ana Elsa"

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big data Black Box Classification data validity data veracity decision tree electronic device electronic device qualification electronics manufacturing feature engineering Feature Selection FMEA incomplete dataset KNN logistic regression production test set compaction random forest Stepwise stop-on-fail test Veracity
Number of items: 22.

big data

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779, Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:10.1109/iCCECE46942.2019.8941849)

Black Box

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)

Classification

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)

data validity

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779, Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:10.1109/iCCECE46942.2019.8941849)

data veracity

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779, Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:10.1109/iCCECE46942.2019.8941849)

decision tree

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881 and Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226 (2019) Data driven predictive model to compact a production stop-on-fail test set for an electronic device. In: Proceedings of the 2018 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE Xplore, pp. 59-64. ISBN 9781538649046 (doi:10.1109/iCCECOME.2018.8658941)

electronic device

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

electronic device qualification

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881 and Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226 (2019) Data driven predictive model to compact a production stop-on-fail test set for an electronic device. In: Proceedings of the 2018 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE Xplore, pp. 59-64. ISBN 9781538649046 (doi:10.1109/iCCECOME.2018.8658941)

electronics manufacturing

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779, Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:10.1109/iCCECE46942.2019.8941849)

feature engineering

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779, Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:10.1109/iCCECE46942.2019.8941849)

Feature Selection

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)

FMEA

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779, Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:10.1109/iCCECE46942.2019.8941849)

incomplete dataset

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881 and Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226 (2019) Data driven predictive model to compact a production stop-on-fail test set for an electronic device. In: Proceedings of the 2018 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE Xplore, pp. 59-64. ISBN 9781538649046 (doi:10.1109/iCCECOME.2018.8658941)

KNN

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)

logistic regression

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

production test set compaction

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881 and Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226 (2019) Data driven predictive model to compact a production stop-on-fail test set for an electronic device. In: Proceedings of the 2018 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE Xplore, pp. 59-64. ISBN 9781538649046 (doi:10.1109/iCCECOME.2018.8658941)

random forest

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, Christopher ORCID logoORCID: https://orcid.org/0000-0002-9438-3879, Walshaw, Christopher ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Yin, Chunyan ORCID logoORCID: https://orcid.org/0000-0003-0298-0420 (2019) Data analytics to reduce stop-on-fail test in electronics manufacturing. Open Computer Sciences, 9 (1). pp. 200-211. ISSN 2299-1093 (Online) (doi:10.1515/comp-2019-0014)

Stepwise

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)

stop-on-fail test

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881 and Stoyanov, Stoyan ORCID logoORCID: https://orcid.org/0000-0001-6091-1226 (2019) Data driven predictive model to compact a production stop-on-fail test set for an electronic device. In: Proceedings of the 2018 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE Xplore, pp. 59-64. ISBN 9781538649046 (doi:10.1109/iCCECOME.2018.8658941)

Veracity

Hinojosa Herrera, Ana Elsa ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Improving Black Box Classification Model Veracity for Electronics Anomaly Detection. In: 2020 15th IEEE Conference on Industrial Electronics and Applications (ICIEA). IEEE, pp. 1092-1097. ISBN 978-1728151694 ISSN 2156-2318 (Print), 2158-2297 (Online) (doi:10.1109/ICIEA48937.2020.9248258)

This list was generated on Sun Dec 22 13:46:39 2024 UTC.