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Items where Author is "Hinojosa Herrera, Ana"

Items where Author is "Hinojosa Herrera, Ana"

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Big Data Data Validity Data Veracity Electronics Manufacturing FMEA Quality Assurance Statistics Test Limits Optimisation
Number of items: 8.

Big Data

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

Data Validity

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

Data Veracity

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

Electronics Manufacturing

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

FMEA

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

Quality Assurance

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

Statistics

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

Test Limits Optimisation

Hinojosa Herrera, Ana ORCID logoORCID: https://orcid.org/0000-0002-0636-1881, Walshaw, Chris ORCID logoORCID: https://orcid.org/0000-0003-0253-7779 and Bailey, Chris ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 (2020) Failure mode & effect analysis and another methodology for improving data veracity and validity. Annals of Emerging Technologies in Computing (AETiC), 4 (3). pp. 9-16. ISSN 2516-0281 (doi:10.33166/AETiC.2020.03.002)

This list was generated on Sun Dec 22 13:02:47 2024 UTC.