Items where Author is "Fu, C."
educational technology
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
engineering education
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
Generative AI
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
privacy
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
problem-solving
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
retrieval augmented generation
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
surveys
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
training
Rana, S. P. ORCID: https://orcid.org/0000-0002-8014-8122, Dey, M., Patel, P., Requena, J. and Fu, C.
(2025)
Prompting and rag vs. student engagement and comprehension in educational technology.
In: 2025 IEEE Global Engineering Education Conference (EDUCON), London, United Kingdom, 2025.
IEEE Xplore
.
Institute of Electrical and Electronics Engineers, Inc. (IEEE), Piscataway, New Jersey, pp. 1-7.
ISBN 979-8331539498
(doi:10.1109/EDUCON62633.2025.11016579)
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