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Items where Author is "Excell, Peter S."

Items where Author is "Excell, Peter S."

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3-Pole 3L-VSC big data data validity data veracity DC Microgrid DC-link electronics manufacturing feature engineering FMEA Limit-based P&O MPPT PV Tank Circuit (TC)
Number of items: 13.

3-Pole

Giwa, Babatunde ORCID: 0000-0001-5178-072X and Habtay, Yehdego (2019) Transient performance enhancement of tank circuited 3-Pole PV based DC microgrid with limit-based P & O MPPT algorithm. In: 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE, pp. 51-55. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941662)

3L-VSC

Giwa, Babatunde ORCID: 0000-0001-5178-072X and Habtay, Yehdego (2019) Transient performance enhancement of tank circuited 3-Pole PV based DC microgrid with limit-based P & O MPPT algorithm. In: 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE, pp. 51-55. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941662)

big data

Hinojosa Herrera, Ana Elsa ORCID: 0000-0002-0636-1881 , Walshaw, Chris ORCID: 0000-0003-0253-7779 , Bailey, Chris ORCID: 0000-0002-9438-3879 and Yin, Chunyan ORCID: 0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941849)

data validity

Hinojosa Herrera, Ana Elsa ORCID: 0000-0002-0636-1881 , Walshaw, Chris ORCID: 0000-0003-0253-7779 , Bailey, Chris ORCID: 0000-0002-9438-3879 and Yin, Chunyan ORCID: 0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941849)

data veracity

Hinojosa Herrera, Ana Elsa ORCID: 0000-0002-0636-1881 , Walshaw, Chris ORCID: 0000-0003-0253-7779 , Bailey, Chris ORCID: 0000-0002-9438-3879 and Yin, Chunyan ORCID: 0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941849)

DC Microgrid

Giwa, Babatunde ORCID: 0000-0001-5178-072X and Habtay, Yehdego (2019) Transient performance enhancement of tank circuited 3-Pole PV based DC microgrid with limit-based P & O MPPT algorithm. In: 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE, pp. 51-55. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941662)

DC-link

Giwa, Babatunde ORCID: 0000-0001-5178-072X and Habtay, Yehdego (2019) Transient performance enhancement of tank circuited 3-Pole PV based DC microgrid with limit-based P & O MPPT algorithm. In: 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE, pp. 51-55. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941662)

electronics manufacturing

Hinojosa Herrera, Ana Elsa ORCID: 0000-0002-0636-1881 , Walshaw, Chris ORCID: 0000-0003-0253-7779 , Bailey, Chris ORCID: 0000-0002-9438-3879 and Yin, Chunyan ORCID: 0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941849)

feature engineering

Hinojosa Herrera, Ana Elsa ORCID: 0000-0002-0636-1881 , Walshaw, Chris ORCID: 0000-0003-0253-7779 , Bailey, Chris ORCID: 0000-0002-9438-3879 and Yin, Chunyan ORCID: 0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941849)

FMEA

Hinojosa Herrera, Ana Elsa ORCID: 0000-0002-0636-1881 , Walshaw, Chris ORCID: 0000-0003-0253-7779 , Bailey, Chris ORCID: 0000-0002-9438-3879 and Yin, Chunyan ORCID: 0000-0003-0298-0420 (2019) Failure mode & effect analysis for improving data veracity and validity. In: Proceedings of the IEEE International Conference on Computing, Electronics & Communications Engineering 2019 (IEEE iCCECE '19). IEEE, pp. 100-105. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941849)

Limit-based P&O MPPT

Giwa, Babatunde ORCID: 0000-0001-5178-072X and Habtay, Yehdego (2019) Transient performance enhancement of tank circuited 3-Pole PV based DC microgrid with limit-based P & O MPPT algorithm. In: 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE, pp. 51-55. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941662)

PV

Giwa, Babatunde ORCID: 0000-0001-5178-072X and Habtay, Yehdego (2019) Transient performance enhancement of tank circuited 3-Pole PV based DC microgrid with limit-based P & O MPPT algorithm. In: 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE, pp. 51-55. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941662)

Tank Circuit (TC)

Giwa, Babatunde ORCID: 0000-0001-5178-072X and Habtay, Yehdego (2019) Transient performance enhancement of tank circuited 3-Pole PV based DC microgrid with limit-based P & O MPPT algorithm. In: 2019 International Conference on Computing, Electronics & Communications Engineering (iCCECE). IEEE, pp. 51-55. ISBN 978-1728121383 (doi:https://doi.org/10.1109/iCCECE46942.2019.8941662)

This list was generated on Thu Nov 21 19:02:44 2024 UTC.