Items where Author is "Durairaj, Raj"
European Synchrotron Radiation Facility (ESRF)
Jackson, Gavin J., Lu, Hua ORCID: https://orcid.org/0000-0002-4392-6562, Durairaj, Raj, Hoo, Nick, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Ekere, Ndy N. and Wright, Jon
(2004)
Intermetallic phase detection in lead-free solders using
synchrotron X-ray diffraction.
Journal of Electronic Materials, 33 (12).
pp. 1524-1529.
ISSN 0361-5235 (Print), 1543-186X (Online)
(doi:10.1007/s11664-004-0094-x)
intermetallic compounds (IMCs)
Jackson, Gavin J., Lu, Hua ORCID: https://orcid.org/0000-0002-4392-6562, Durairaj, Raj, Hoo, Nick, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Ekere, Ndy N. and Wright, Jon
(2004)
Intermetallic phase detection in lead-free solders using
synchrotron X-ray diffraction.
Journal of Electronic Materials, 33 (12).
pp. 1524-1529.
ISSN 0361-5235 (Print), 1543-186X (Online)
(doi:10.1007/s11664-004-0094-x)
lead-free solder
Jackson, Gavin J., Lu, Hua ORCID: https://orcid.org/0000-0002-4392-6562, Durairaj, Raj, Hoo, Nick, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Ekere, Ndy N. and Wright, Jon
(2004)
Intermetallic phase detection in lead-free solders using
synchrotron X-ray diffraction.
Journal of Electronic Materials, 33 (12).
pp. 1524-1529.
ISSN 0361-5235 (Print), 1543-186X (Online)
(doi:10.1007/s11664-004-0094-x)
reliability
Jackson, Gavin J., Lu, Hua ORCID: https://orcid.org/0000-0002-4392-6562, Durairaj, Raj, Hoo, Nick, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Ekere, Ndy N. and Wright, Jon
(2004)
Intermetallic phase detection in lead-free solders using
synchrotron X-ray diffraction.
Journal of Electronic Materials, 33 (12).
pp. 1524-1529.
ISSN 0361-5235 (Print), 1543-186X (Online)
(doi:10.1007/s11664-004-0094-x)
synchrotron
Jackson, Gavin J., Lu, Hua ORCID: https://orcid.org/0000-0002-4392-6562, Durairaj, Raj, Hoo, Nick, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Ekere, Ndy N. and Wright, Jon
(2004)
Intermetallic phase detection in lead-free solders using
synchrotron X-ray diffraction.
Journal of Electronic Materials, 33 (12).
pp. 1524-1529.
ISSN 0361-5235 (Print), 1543-186X (Online)
(doi:10.1007/s11664-004-0094-x)
X-ray diffraction (XRD)
Jackson, Gavin J., Lu, Hua ORCID: https://orcid.org/0000-0002-4392-6562, Durairaj, Raj, Hoo, Nick, Bailey, Chris
ORCID: https://orcid.org/0000-0002-9438-3879, Ekere, Ndy N. and Wright, Jon
(2004)
Intermetallic phase detection in lead-free solders using
synchrotron X-ray diffraction.
Journal of Electronic Materials, 33 (12).
pp. 1524-1529.
ISSN 0361-5235 (Print), 1543-186X (Online)
(doi:10.1007/s11664-004-0094-x)