Items where Author is "Dixon, J.H."
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Up a levelbreast
Kosmas, P., Laranjeira, S., Dixon, J.H., Li, X. and Chen, Y. (2010) Time reversal microwave breast imaging for contrast-enhanced tumor classification. In: Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 708-711. ISBN 978-1-4244-4123-5 (print) ISSN 1557-170X (online) (doi:10.1109/IEMBS.2010.5626158)
cancer
Kosmas, P., Laranjeira, S., Dixon, J.H., Li, X. and Chen, Y. (2010) Time reversal microwave breast imaging for contrast-enhanced tumor classification. In: Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 708-711. ISBN 978-1-4244-4123-5 (print) ISSN 1557-170X (online) (doi:10.1109/IEMBS.2010.5626158)
lesions
Kosmas, P., Laranjeira, S., Dixon, J.H., Li, X. and Chen, Y. (2010) Time reversal microwave breast imaging for contrast-enhanced tumor classification. In: Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 708-711. ISBN 978-1-4244-4123-5 (print) ISSN 1557-170X (online) (doi:10.1109/IEMBS.2010.5626158)
microwave imaging
Kosmas, P., Laranjeira, S., Dixon, J.H., Li, X. and Chen, Y. (2010) Time reversal microwave breast imaging for contrast-enhanced tumor classification. In: Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 708-711. ISBN 978-1-4244-4123-5 (print) ISSN 1557-170X (online) (doi:10.1109/IEMBS.2010.5626158)
shape
Kosmas, P., Laranjeira, S., Dixon, J.H., Li, X. and Chen, Y. (2010) Time reversal microwave breast imaging for contrast-enhanced tumor classification. In: Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE. Institute of Electrical and Electronics Engineers, Inc., Piscataway, NJ, USA, pp. 708-711. ISBN 978-1-4244-4123-5 (print) ISSN 1557-170X (online) (doi:10.1109/IEMBS.2010.5626158)