Items where Author is "Davennel, C."
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finite element modelling
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
matrix
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
mechanical loading
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
reinforcement method
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
reinforcement technique
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
SAC alloy
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
second level
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
solder balls
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
time to failure
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
underfilling
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)
vibration test
Berthou, M., Lu, H. ORCID: 0000-0002-4392-6562 , Retailleau, P., Frémont, H., Guédon-Gracia, A., Davennel, C. and Bailey, C. ORCID: 0000-0002-9438-3879 (2011) Vibration test durability on large BGA assemblies: evaluation of reinforcement techniques. In: 2010 IEEE CPMT Symposium Japan, ICSJ10. IEEE Computer Society, Piscataway, USA, pp. 1-4. ISBN 9781424475933 (doi:https://doi.org/10.1109/CPMTSYMPJ.2010.5679536)