Piazza, Anna ORCID: https://orcid.org/0000-0002-5785-6948, Vasudevan, Srinidhi ORCID: https://orcid.org/0000-0002-8584-9112 and Carr, Madeline (2024) Am I Hired as a Firefighter? Exploring the role ambiguity and board's engagements on job stress and perceived organizational support of CISOs. In: 2024 2nd International Conference on Cyber Resilience (ICCR), Dubai, United Arab Emirates, 26th -28th February, 2024. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-9. ISBN 979-8350394962; 979-8350394979 (doi:10.1109/ICCR61006.2024.10532977)

Piazza, Anna ORCID: https://orcid.org/0000-0002-5785-6948, Vasudevan, Srinidhi ORCID: https://orcid.org/0000-0002-8584-9112 and Carr, Madeline (2023) Cybersecurity in UK universities: mapping (or managing) threat intelligence sharing within the higher education sector. Journal of Cybersecurity, 9 (1). pp. 1-15. ISSN 2057-2085 (Print), 2057-2093 (Online) (doi:10.1093/cybsec/tyad019)

Vasudevan, Srinidhi ORCID: https://orcid.org/0000-0002-8584-9112, Piazza, Anna ORCID: https://orcid.org/0000-0002-5785-6948 and Carr, Madeline (2023) A decade of studies on cyber security training in organizations using social network analysis: a systematic literature review through keyword co-occurrence network. In: 2nd International Conference on Business Analytics for Technology and Security (ICBATS). 7th - 8th March 2023, Khalifa University, Dubai, United Arab Emirates. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-6. ISBN 979-8350335644; 979-8350335651 ISSN 2473-2001 (Online) (doi:10.1109/ICBATS57792.2023.10111127)

Vasudevan, Srinidhi ORCID: https://orcid.org/0000-0002-8584-9112, Piazza, Anna ORCID: https://orcid.org/0000-0002-5785-6948 and Carr, Madeline (2022) Qualitative factors in organizational cyber resilience. In: 2022 International Conference on Cyber Resilience (ICCR), Dubai, United Arab Emirates, 6th - 7th October 2022. IEEE Xplore . Institute of Electrical and Electronics Engineers (IEEE), Piscataway, New Jersey, pp. 1-5. ISBN 978-1665461221; 978-1665461238 ISSN 2473-2001 (Online) (doi:10.1109/ICCR56254.2022.9995762)