Items where Author is "Bailey, ChriS"
(LEDs)
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)
accelerated aging
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)
Light Emitting Diodes
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)
lubricating oils
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)
monitoring
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)
nickel
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)
noise
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)
reliability
Sutharssan, Thamo, Bailey, ChriS ORCID: https://orcid.org/0000-0002-9438-3879 and Stoyanov, Stoyan
ORCID: https://orcid.org/0000-0001-6091-1226
(2012)
A comparison study of the prognostics approaches to light emitting diodes under accelerated aging.
In: 2012 13th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
Institute of Electrical and Electronic Engineers, Inc, Piscataway, N.J., USA.
ISBN 978-1-4673-1512-8
(doi:10.1109/ESimE.2012.6191783)