Conference Proceedings

Anang, K. A., Bello, L., Eneh, T. I., Bakalis, P. and Rapajic, P. B. (2012) The performance of dynamic source routing protocol to path loss models at carrier frequencies above 2 GHz. In: 2011 IEEE 13th International Conference on Communication Technology (ICCT). Institute of Electronic and Electrical Engineers, Inc., Piscataway, NJ, USA, pp. 151-155. ISBN 978-1-61284-306-3 (print) (doi:https://doi.org/10.1109/ICCT.2011.6157852)

Bello, L., Anang, K. A., Bakalis, P., Rapajic, P. B. and Eneh, Titus I. (2012) Sensitivity of DSR protocol performance to propagation loss models at higher microwave frequencies. In: 2012 Proceedings 14th International Conference on Modelling and Simulation (UKSim). IEEE Conference Publications . The Institute of Electrical and Electronics Engineers, Inc, California & Washington, USA and Tokyo, Japan, pp. 561-565. ISBN 978-0-7695-4682-7 (doi:https://doi.org/10.1109/UKSim.2012.85)

Bello, L., Bakalis, P., Manam, S. J., Eneh, T. I. and Anang, K. A. (2011) Power control and performance comparison of AODV and DSR ad hoc routing protocols. In: Computer Modelling and Simulation (UKSim), 2011 UkSim 13th International Conference on. Institute of Electrical and Electronics Engineers, Piscataway, NJ, USA, pp. 457-460. ISBN 978-1-61284-705-4 (doi:https://doi.org/10.1109/UKSIM.2011.93)

Bello, L., Bakalis, P., Manam, S. J., Eneh, T. I. and Anang, K. A. (2011) Power control and performance comparison of AODV and DSR ad hoc routing protocols. In: Proceedings 2011 UKSim 13th International Conference on Modelling and Simulation (UkSim 2011). IEEE Conference Publications, 1 . Institute of Electrical and Electronics Engineers (IEEE), Los Alamitos, Caifornia and Washington, US. Tokyo, Japan, pp. 457-460. ISBN 978-0-7695-4376-5 (doi:https://doi.org/10.1109/UKSIM.2011.93)

Bello, L., Bakalis, P., Chintalapudi, P., Anang, K. A. and Eneh, T. I. (2011) Impact of topology control and traffic models performance on mobile ad hoc wireless routing protocol. In: 2011 Future of Instrumentation International Workshop (FIIW) Proceedings. IEEE, Piscataway, NJ, USA, pp. 158-159. ISBN 978-1-4673-5835-4 (doi:https://doi.org/10.1109/FIIW.2011.6476823)