aging characterization methodology

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

battery aging

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

battery management system (BMS)

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

Data driven prognostics

Ahsan, Mominul, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 and Bailey, Christopher ORCID: 0000-0002-9438-3879 (2018) Data driven prognostics for failure of power semiconductor packages. In: Proceedings of 41st Spring Seminar on Electronics Technology (ISSE). IEEE Xplore, pp. 1-6. ISBN 978-1-5386-5730-0 ISSN 2161-2536 (Online) (doi:https://doi.org/10.1109/ISSE.2018.8443612)

data mining

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

electronic components

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

Failure

Ahsan, Mominul, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 and Bailey, Christopher ORCID: 0000-0002-9438-3879 (2018) Data driven prognostics for failure of power semiconductor packages. In: Proceedings of 41st Spring Seminar on Electronics Technology (ISSE). IEEE Xplore, pp. 1-6. ISBN 978-1-5386-5730-0 ISSN 2161-2536 (Online) (doi:https://doi.org/10.1109/ISSE.2018.8443612)

intelligent manufacturing

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

Li-ion battery

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

machine learning

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

Ahsan, Mominul, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 and Bailey, Christopher ORCID: 0000-0002-9438-3879 (2018) Data driven prognostics for failure of power semiconductor packages. In: Proceedings of 41st Spring Seminar on Electronics Technology (ISSE). IEEE Xplore, pp. 1-6. ISBN 978-1-5386-5730-0 ISSN 2161-2536 (Online) (doi:https://doi.org/10.1109/ISSE.2018.8443612)

Power semiconductor packages

Ahsan, Mominul, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 and Bailey, Christopher ORCID: 0000-0002-9438-3879 (2018) Data driven prognostics for failure of power semiconductor packages. In: Proceedings of 41st Spring Seminar on Electronics Technology (ISSE). IEEE Xplore, pp. 1-6. ISBN 978-1-5386-5730-0 ISSN 2161-2536 (Online) (doi:https://doi.org/10.1109/ISSE.2018.8443612)

prognostics modelling

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

Reliability test

Ahsan, Mominul, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 and Bailey, Christopher ORCID: 0000-0002-9438-3879 (2018) Data driven prognostics for failure of power semiconductor packages. In: Proceedings of 41st Spring Seminar on Electronics Technology (ISSE). IEEE Xplore, pp. 1-6. ISBN 978-1-5386-5730-0 ISSN 2161-2536 (Online) (doi:https://doi.org/10.1109/ISSE.2018.8443612)

smart qualification testing

Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul, Bailey, Chris ORCID: 0000-0002-9438-3879 , Wotherspoon, Tracy and Hunt, Craig (2019) Predictive analytics methodology for smart qualification testing of electronic components. Journal of Intelligent Manufacturing, 30 (3). pp. 1497-1514. ISSN 0956-5515 (Print), 1572-8145 (Online) (doi:https://doi.org/10.1007/s10845-018-01462-9)

state estimation

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

state of charge (SOC)

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

state of function (SOF)

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

state of health (SOH)

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)

state of power (SOP)

Roy, Probir Kumar, Shahjalal, Mohammad, Shams, Tamanna, Fly, Ashley, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Ahsan, Mominul and Haider, Julfikar (2023) A critical review on battery aging and state estimation technologies of lithium-ion batteries: prospects and issues. Electronics, 12 (19):4105. pp. 1-30. ISSN 2079-9292 (Online) (doi:https://doi.org/10.3390/electronics12194105)